Klotz, Jeremy, Rengarajan, Vijay, and Sankaranarayanan, Aswin C. Fine-Grain Prediction of Strawberry Freshness using Subsurface Scattering. Retrieved from https://par.nsf.gov/biblio/10298880. 2021 IEEE/CVF International Conference on Computer Vision Workshops (ICCVW) . Web. doi:10.1109/ICCVW54120.2021.00264.
Klotz, Jeremy, Rengarajan, Vijay, & Sankaranarayanan, Aswin C. Fine-Grain Prediction of Strawberry Freshness using Subsurface Scattering. 2021 IEEE/CVF International Conference on Computer Vision Workshops (ICCVW), (). Retrieved from https://par.nsf.gov/biblio/10298880. https://doi.org/10.1109/ICCVW54120.2021.00264
Klotz, Jeremy, Rengarajan, Vijay, and Sankaranarayanan, Aswin C.
"Fine-Grain Prediction of Strawberry Freshness using Subsurface Scattering". 2021 IEEE/CVF International Conference on Computer Vision Workshops (ICCVW) (). Country unknown/Code not available. https://doi.org/10.1109/ICCVW54120.2021.00264.https://par.nsf.gov/biblio/10298880.
@article{osti_10298880,
place = {Country unknown/Code not available},
title = {Fine-Grain Prediction of Strawberry Freshness using Subsurface Scattering},
url = {https://par.nsf.gov/biblio/10298880},
DOI = {10.1109/ICCVW54120.2021.00264},
abstractNote = {},
journal = {2021 IEEE/CVF International Conference on Computer Vision Workshops (ICCVW)},
author = {Klotz, Jeremy and Rengarajan, Vijay and Sankaranarayanan, Aswin C.},
}
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