Kumari, Preeti, Surendranathan, Umeshwarnath, Wasiolek, Maryla, Hattar, Khalid, Bhat, Narayana P., and Ray, Biswajit. Radiation-Induced Error Mitigation by Read-Retry Technique for MLC 3-D NAND Flash Memory. Retrieved from https://par.nsf.gov/biblio/10301365. IEEE Transactions on Nuclear Science 68.5 Web. doi:10.1109/TNS.2021.3052909.

Kumari, Preeti, Surendranathan, Umeshwarnath, Wasiolek, Maryla, Hattar, Khalid, Bhat, Narayana P., & Ray, Biswajit. Radiation-Induced Error Mitigation by Read-Retry Technique for MLC 3-D NAND Flash Memory. IEEE Transactions on Nuclear Science, 68 (5). Retrieved from https://par.nsf.gov/biblio/10301365. https://doi.org/10.1109/TNS.2021.3052909

Kumari, Preeti, Surendranathan, Umeshwarnath, Wasiolek, Maryla, Hattar, Khalid, Bhat, Narayana P., and Ray, Biswajit. "Radiation-Induced Error Mitigation by Read-Retry Technique for MLC 3-D NAND Flash Memory". IEEE Transactions on Nuclear Science 68 (5). Country unknown/Code not available. https://doi.org/10.1109/TNS.2021.3052909. https://par.nsf.gov/biblio/10301365.

@article{osti_10301365,
place = {Country unknown/Code not available}, title = {Radiation-Induced Error Mitigation by Read-Retry Technique for MLC 3-D NAND Flash Memory}, url = {https://par.nsf.gov/biblio/10301365}, DOI = {10.1109/TNS.2021.3052909}, abstractNote = {}, journal = {IEEE Transactions on Nuclear Science}, volume = {68}, number = {5}, author = {Kumari, Preeti and Surendranathan, Umeshwarnath and Wasiolek, Maryla and Hattar, Khalid and Bhat, Narayana P. and Ray, Biswajit}, editor = {null} }