McKeon, Brandon S., Liu, Xinyu, Furdyna, Jacek K., and Smith, David J. Atomic-Resolution Structure Imaging of Misfit Dislocations at Heterovalent II–VI/III–V Interfaces. Retrieved from https://par.nsf.gov/biblio/10301738. ACS Applied Electronic Materials 3.6 Web. doi:10.1021/acsaelm.1c00139.

McKeon, Brandon S., Liu, Xinyu, Furdyna, Jacek K., & Smith, David J. Atomic-Resolution Structure Imaging of Misfit Dislocations at Heterovalent II–VI/III–V Interfaces. ACS Applied Electronic Materials, 3 (6). Retrieved from https://par.nsf.gov/biblio/10301738. https://doi.org/10.1021/acsaelm.1c00139

McKeon, Brandon S., Liu, Xinyu, Furdyna, Jacek K., and Smith, David J. "Atomic-Resolution Structure Imaging of Misfit Dislocations at Heterovalent II–VI/III–V Interfaces". ACS Applied Electronic Materials 3 (6). Country unknown/Code not available. https://doi.org/10.1021/acsaelm.1c00139. https://par.nsf.gov/biblio/10301738.

@article{osti_10301738,
place = {Country unknown/Code not available}, title = {Atomic-Resolution Structure Imaging of Misfit Dislocations at Heterovalent II–VI/III–V Interfaces}, url = {https://par.nsf.gov/biblio/10301738}, DOI = {10.1021/acsaelm.1c00139}, abstractNote = {}, journal = {ACS Applied Electronic Materials}, volume = {3}, number = {6}, author = {McKeon, Brandon S. and Liu, Xinyu and Furdyna, Jacek K. and Smith, David J.}, editor = {null} }