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The light-emitting diodes (LEDs) used in indoor testing of perovskite solar cells do not expose them to the levels of ultraviolet (UV) radiation that they would receive in actual outdoor use. We report degradation mechanisms of p-i-n–structured perovskite solar cells under unfiltered sunlight and with LEDs. Weak chemical bonding between perovskites and polymer hole-transporting materials (HTMs) and transparent conducting oxides (TCOs) dominate the accelerated A-site cation migration, rather than direct degradation of HTMs. An aromatic phosphonic acid, [2-(9-ethyl-9H-carbazol-3-yl)ethyl]phosphonic acid (EtCz3EPA), enhanced bonding at the perovskite/HTM/TCO region with a phosphonic acid group bonded to TCOs and a nitrogen group interacting with lead in perovskites. A hybrid HTM of EtCz3EPA with strong hole-extraction polymers retained high efficiency and improved the UV stability of perovskite devices, and a champion perovskite minimodule—independently measured by the Perovskite PV Accelerator for Commercializing Technologies (PACT) center—retained operational efficiency of >16% after 29 weeks of outdoor testing.
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Operational stability of perovskite light emitting diodes
Abstract Organometal halide perovskite light emitting diodes (LEDs) have attracted a lot of attention in recent years, owing to the rapid progress in device efficiency. However, their short operational lifetime severely impedes the practical uses of these devices. The operating stability of perovskite LEDs are due to degradation due to ambient environment and degradation during operation. The former can be suppressed by encapsulation while the latter one is the intrinsic degradation due to the electrochemical stability of the perovskite materials. In addition, perovskites also suffer from ion migration which is a major degradation mechanism in perovskite LEDs. In this review, we specifically focus on the operational stability of perovskite LEDs. The review is divided into two parts: the first part contains a summary of various degradation mechanisms and some insight on the degradation behavior and the second part is the strategies how to improve the operational stability, especially the strategies to suppress ion migration. Based on the current advances in the literature, we finally present our perspectives to improve the device stability.
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- Award ID(s):
- 1729383
- PAR ID:
- 10303135
- Publisher / Repository:
- IOP Publishing
- Date Published:
- Journal Name:
- Journal of Physics: Materials
- Volume:
- 3
- Issue:
- 1
- ISSN:
- 2515-7639
- Page Range / eLocation ID:
- Article No. 012002
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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