Blumer, Ari N., Boyer, Jacob T., Deitz, Julia I., Rodriguez, Francisco A., and Grassman, Tyler J. Quantitative Characterization of Misfit Dislocations at GaP/Si Heteroepitaxial Interfaces via Electron Channeling Contrast Imaging and Semi-Automated Image Analysis. Retrieved from https://par.nsf.gov/biblio/10327690. Microscopy and Microanalysis 25.S2 Web. doi:10.1017/S1431927619001740.

Blumer, Ari N., Boyer, Jacob T., Deitz, Julia I., Rodriguez, Francisco A., & Grassman, Tyler J. Quantitative Characterization of Misfit Dislocations at GaP/Si Heteroepitaxial Interfaces via Electron Channeling Contrast Imaging and Semi-Automated Image Analysis. Microscopy and Microanalysis, 25 (S2). Retrieved from https://par.nsf.gov/biblio/10327690. https://doi.org/10.1017/S1431927619001740

Blumer, Ari N., Boyer, Jacob T., Deitz, Julia I., Rodriguez, Francisco A., and Grassman, Tyler J. "Quantitative Characterization of Misfit Dislocations at GaP/Si Heteroepitaxial Interfaces via Electron Channeling Contrast Imaging and Semi-Automated Image Analysis". Microscopy and Microanalysis 25 (S2). Country unknown/Code not available. https://doi.org/10.1017/S1431927619001740. https://par.nsf.gov/biblio/10327690.

@article{osti_10327690,
place = {Country unknown/Code not available}, title = {Quantitative Characterization of Misfit Dislocations at GaP/Si Heteroepitaxial Interfaces via Electron Channeling Contrast Imaging and Semi-Automated Image Analysis}, url = {https://par.nsf.gov/biblio/10327690}, DOI = {10.1017/S1431927619001740}, abstractNote = {}, journal = {Microscopy and Microanalysis}, volume = {25}, number = {S2}, author = {Blumer, Ari N. and Boyer, Jacob T. and Deitz, Julia I. and Rodriguez, Francisco A. and Grassman, Tyler J.}, }