Sayyah Ensan, Sina, Nagarajan, Karthikeyan, Khan, Mohammad Nasim, and Ghosh, Swaroop. SCARE: Side Channel Attack on In-Memory Computing for Reverse Engineering. Retrieved from https://par.nsf.gov/biblio/10330062. IEEE Transactions on Very Large Scale Integration (VLSI) Systems 29.12 Web. doi:10.1109/TVLSI.2021.3110744.

Sayyah Ensan, Sina, Nagarajan, Karthikeyan, Khan, Mohammad Nasim, & Ghosh, Swaroop. SCARE: Side Channel Attack on In-Memory Computing for Reverse Engineering. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 29 (12). Retrieved from https://par.nsf.gov/biblio/10330062. https://doi.org/10.1109/TVLSI.2021.3110744

Sayyah Ensan, Sina, Nagarajan, Karthikeyan, Khan, Mohammad Nasim, and Ghosh, Swaroop. "SCARE: Side Channel Attack on In-Memory Computing for Reverse Engineering". IEEE Transactions on Very Large Scale Integration (VLSI) Systems 29 (12). Country unknown/Code not available. https://doi.org/10.1109/TVLSI.2021.3110744. https://par.nsf.gov/biblio/10330062.

@article{osti_10330062,
place = {Country unknown/Code not available}, title = {SCARE: Side Channel Attack on In-Memory Computing for Reverse Engineering}, url = {https://par.nsf.gov/biblio/10330062}, DOI = {10.1109/TVLSI.2021.3110744}, abstractNote = {}, journal = {IEEE Transactions on Very Large Scale Integration (VLSI) Systems}, volume = {29}, number = {12}, author = {Sayyah Ensan, Sina and Nagarajan, Karthikeyan and Khan, Mohammad Nasim and Ghosh, Swaroop}, }