Single-Sweep vs. Banded Characterization of a D-band Ultra-Low-Loss SiC Substrate Integrated Waveguide

L. Li; S. Reyes; M. Asadi; D. Jena; H. Xing; P. Fay; J. Hwang

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Citation Details

Single-Sweep vs. Banded Characterization of a D-band Ultra-Low-Loss SiC Substrate Integrated Waveguide

Award ID(s):: 2132329

PAR ID:: 10338225

Author(s) / Creator(s):: L. Li; S. Reyes; M. Asadi; D. Jena; H. Xing; P. Fay; J. Hwang

Date Published:: 2022-06-23

Journal Name:: ARFTG Microwave Measurement Conference

Format(s):: Medium: X

Sponsoring Org:: National Science Foundation

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Accepted Manuscript1.0
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