Monolithic 3D semiconductor footprint scaling exploration based on VFET standard cell layout methodology, design flow, and EDA platform
- Award ID(s):
- 2110419
- PAR ID:
- 10342988
- Editor(s):
- Moaiyeri, Mohammad Hossein
- Date Published:
- Journal Name:
- IEEE access
- ISSN:
- 2169-3536
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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