Yang, Chih-Hsuan, Pokuri, Balaji Sesha, Lee, Xian Yeow, Balakrishnan, Sangeeth, Hegde, Chinmay, Sarkar, Soumik, and Ganapathysubramanian, Baskar. Multi-fidelity machine learning models for structure–property mapping of organic electronics. Retrieved from https://par.nsf.gov/biblio/10344335. Computational Materials Science 213.C Web. doi:10.1016/j.commatsci.2022.111599.

Yang, Chih-Hsuan, Pokuri, Balaji Sesha, Lee, Xian Yeow, Balakrishnan, Sangeeth, Hegde, Chinmay, Sarkar, Soumik, & Ganapathysubramanian, Baskar. Multi-fidelity machine learning models for structure–property mapping of organic electronics. Computational Materials Science, 213 (C). Retrieved from https://par.nsf.gov/biblio/10344335. https://doi.org/10.1016/j.commatsci.2022.111599

Yang, Chih-Hsuan, Pokuri, Balaji Sesha, Lee, Xian Yeow, Balakrishnan, Sangeeth, Hegde, Chinmay, Sarkar, Soumik, and Ganapathysubramanian, Baskar. "Multi-fidelity machine learning models for structure–property mapping of organic electronics". Computational Materials Science 213 (C). Country unknown/Code not available. https://doi.org/10.1016/j.commatsci.2022.111599. https://par.nsf.gov/biblio/10344335.

@article{osti_10344335,
place = {Country unknown/Code not available}, title = {Multi-fidelity machine learning models for structure–property mapping of organic electronics}, url = {https://par.nsf.gov/biblio/10344335}, DOI = {10.1016/j.commatsci.2022.111599}, abstractNote = {}, journal = {Computational Materials Science}, volume = {213}, number = {C}, author = {Yang, Chih-Hsuan and Pokuri, Balaji Sesha and Lee, Xian Yeow and Balakrishnan, Sangeeth and Hegde, Chinmay and Sarkar, Soumik and Ganapathysubramanian, Baskar}, }