Using the ANOVA F-Statistic to Rapidly Identify Near-Field Vulnerabilities of Cryptographic Modules
- Award ID(s):
- 1901446
- PAR ID:
- 10344349
- Date Published:
- Journal Name:
- IEEE MTT-S International Microwave Symposium (IMS)
- Page Range / eLocation ID:
- 112 to 115
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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- Free Publicly Accessible Full Text
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Accepted Manuscript1.0
- Conference Paper:
- https://doi.org/10.1109/IMS19712.2021.9575028
