Iyer, Vishnuvardhan, Thimmaiah, Aditya, and Yilmaz, Ali. Testing the Resilience of Cryptographic Modules Against Fine-Grained Time- and Frequency-Domain EM Side-Channel Analysis Attacks. Retrieved from https://par.nsf.gov/biblio/10344350. 2021 International Conference on Electromagnetics in Advanced Applications (ICEAA) . Web. doi:10.1109/ICEAA52647.2021.9539534.

Iyer, Vishnuvardhan, Thimmaiah, Aditya, & Yilmaz, Ali. Testing the Resilience of Cryptographic Modules Against Fine-Grained Time- and Frequency-Domain EM Side-Channel Analysis Attacks. 2021 International Conference on Electromagnetics in Advanced Applications (ICEAA), (). Retrieved from https://par.nsf.gov/biblio/10344350. https://doi.org/10.1109/ICEAA52647.2021.9539534

Iyer, Vishnuvardhan, Thimmaiah, Aditya, and Yilmaz, Ali. "Testing the Resilience of Cryptographic Modules Against Fine-Grained Time- and Frequency-Domain EM Side-Channel Analysis Attacks". 2021 International Conference on Electromagnetics in Advanced Applications (ICEAA) (). Country unknown/Code not available. https://doi.org/10.1109/ICEAA52647.2021.9539534. https://par.nsf.gov/biblio/10344350.

@article{osti_10344350,
place = {Country unknown/Code not available}, title = {Testing the Resilience of Cryptographic Modules Against Fine-Grained Time- and Frequency-Domain EM Side-Channel Analysis Attacks}, url = {https://par.nsf.gov/biblio/10344350}, DOI = {10.1109/ICEAA52647.2021.9539534}, abstractNote = {}, journal = {2021 International Conference on Electromagnetics in Advanced Applications (ICEAA)}, author = {Iyer, Vishnuvardhan and Thimmaiah, Aditya and Yilmaz, Ali}, }