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Title: Emulating Radiation-Induced Multicell Upset Patterns in SRAM FPGAs With Fault Injection
Award ID(s):
1738550
PAR ID:
10345468
Author(s) / Creator(s):
; ;
Date Published:
Journal Name:
IEEE Transactions on Nuclear Science
Volume:
68
Issue:
8
ISSN:
0018-9499
Page Range / eLocation ID:
1594 to 1599
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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