Horwath, James P., Vyas, Leena, Zakharov, Dmitri N., Mégret, Rémi, Voorhees, Peter W., and Stach, Eric A. Exploiting Automatic Image Processing and In-situ Transmission Electron Microscopy to Understand the Stability of Supported Nanoparticles. Retrieved from https://par.nsf.gov/biblio/10348520. Microscopy and Microanalysis 28.S1 Web. doi:10.1017/S1431927622011588.

Horwath, James P., Vyas, Leena, Zakharov, Dmitri N., Mégret, Rémi, Voorhees, Peter W., & Stach, Eric A. Exploiting Automatic Image Processing and In-situ Transmission Electron Microscopy to Understand the Stability of Supported Nanoparticles. Microscopy and Microanalysis, 28 (S1). Retrieved from https://par.nsf.gov/biblio/10348520. https://doi.org/10.1017/S1431927622011588

Horwath, James P., Vyas, Leena, Zakharov, Dmitri N., Mégret, Rémi, Voorhees, Peter W., and Stach, Eric A. "Exploiting Automatic Image Processing and In-situ Transmission Electron Microscopy to Understand the Stability of Supported Nanoparticles". Microscopy and Microanalysis 28 (S1). Country unknown/Code not available. https://doi.org/10.1017/S1431927622011588. https://par.nsf.gov/biblio/10348520.

@article{osti_10348520,
place = {Country unknown/Code not available}, title = {Exploiting Automatic Image Processing and In-situ Transmission Electron Microscopy to Understand the Stability of Supported Nanoparticles}, url = {https://par.nsf.gov/biblio/10348520}, DOI = {10.1017/S1431927622011588}, abstractNote = {}, journal = {Microscopy and Microanalysis}, volume = {28}, number = {S1}, author = {Horwath, James P. and Vyas, Leena and Zakharov, Dmitri N. and Mégret, Rémi and Voorhees, Peter W. and Stach, Eric A.}, }