Hung, Shao-Chun, Lu, Yi-Chen, Lim, Sung Kyu, and Chakrabarty, Krishnendu. Power Supply Noise-Aware At-Speed Delay Fault Testing of Monolithic 3-D ICs. Retrieved from https://par.nsf.gov/biblio/10348938. IEEE Transactions on Very Large Scale Integration (VLSI) Systems 29.11 Web. doi:10.1109/TVLSI.2021.3108787.

Hung, Shao-Chun, Lu, Yi-Chen, Lim, Sung Kyu, & Chakrabarty, Krishnendu. Power Supply Noise-Aware At-Speed Delay Fault Testing of Monolithic 3-D ICs. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 29 (11). Retrieved from https://par.nsf.gov/biblio/10348938. https://doi.org/10.1109/TVLSI.2021.3108787

Hung, Shao-Chun, Lu, Yi-Chen, Lim, Sung Kyu, and Chakrabarty, Krishnendu. "Power Supply Noise-Aware At-Speed Delay Fault Testing of Monolithic 3-D ICs". IEEE Transactions on Very Large Scale Integration (VLSI) Systems 29 (11). Country unknown/Code not available. https://doi.org/10.1109/TVLSI.2021.3108787. https://par.nsf.gov/biblio/10348938.

@article{osti_10348938,
place = {Country unknown/Code not available}, title = {Power Supply Noise-Aware At-Speed Delay Fault Testing of Monolithic 3-D ICs}, url = {https://par.nsf.gov/biblio/10348938}, DOI = {10.1109/TVLSI.2021.3108787}, abstractNote = {}, journal = {IEEE Transactions on Very Large Scale Integration (VLSI) Systems}, volume = {29}, number = {11}, author = {Hung, Shao-Chun and Lu, Yi-Chen and Lim, Sung Kyu and Chakrabarty, Krishnendu}, }