Zhang, Weite, Gomez-Sousa, Hipolito, Heredia-Juesas, Juan, and Martinez-Lorenzo, Jose A. Single-Frequency Imaging and Material Characterization Using Reconfigurable Reflectarrays. Retrieved from https://par.nsf.gov/biblio/10349566. IEEE Transactions on Microwave Theory and Techniques 69.7 Web. doi:10.1109/TMTT.2021.3061597.

Zhang, Weite, Gomez-Sousa, Hipolito, Heredia-Juesas, Juan, & Martinez-Lorenzo, Jose A. Single-Frequency Imaging and Material Characterization Using Reconfigurable Reflectarrays. IEEE Transactions on Microwave Theory and Techniques, 69 (7). Retrieved from https://par.nsf.gov/biblio/10349566. https://doi.org/10.1109/TMTT.2021.3061597

Zhang, Weite, Gomez-Sousa, Hipolito, Heredia-Juesas, Juan, and Martinez-Lorenzo, Jose A. "Single-Frequency Imaging and Material Characterization Using Reconfigurable Reflectarrays". IEEE Transactions on Microwave Theory and Techniques 69 (7). Country unknown/Code not available. https://doi.org/10.1109/TMTT.2021.3061597. https://par.nsf.gov/biblio/10349566.

@article{osti_10349566,
place = {Country unknown/Code not available}, title = {Single-Frequency Imaging and Material Characterization Using Reconfigurable Reflectarrays}, url = {https://par.nsf.gov/biblio/10349566}, DOI = {10.1109/TMTT.2021.3061597}, abstractNote = {}, journal = {IEEE Transactions on Microwave Theory and Techniques}, volume = {69}, number = {7}, author = {Zhang, Weite and Gomez-Sousa, Hipolito and Heredia-Juesas, Juan and Martinez-Lorenzo, Jose A.}, }