Knipfer, B., Xu, S., Kirch, J.D., Botez, D., and Mawst, L.J. Analysis of interface roughness in strained InGaAs/AlInAs quantum cascade laser structures (λ ∼ 4.6 μm) by atom probe tomography. Retrieved from https://par.nsf.gov/biblio/10350747. Journal of Crystal Growth 583.C Web. doi:10.1016/j.jcrysgro.2022.126531.

Knipfer, B., Xu, S., Kirch, J.D., Botez, D., & Mawst, L.J. Analysis of interface roughness in strained InGaAs/AlInAs quantum cascade laser structures (λ ∼ 4.6 μm) by atom probe tomography. Journal of Crystal Growth, 583 (C). Retrieved from https://par.nsf.gov/biblio/10350747. https://doi.org/10.1016/j.jcrysgro.2022.126531

Knipfer, B., Xu, S., Kirch, J.D., Botez, D., and Mawst, L.J. "Analysis of interface roughness in strained InGaAs/AlInAs quantum cascade laser structures (λ ∼ 4.6 μm) by atom probe tomography". Journal of Crystal Growth 583 (C). Country unknown/Code not available. https://doi.org/10.1016/j.jcrysgro.2022.126531. https://par.nsf.gov/biblio/10350747.

@article{osti_10350747,
place = {Country unknown/Code not available}, title = {Analysis of interface roughness in strained InGaAs/AlInAs quantum cascade laser structures (λ ∼ 4.6 μm) by atom probe tomography}, url = {https://par.nsf.gov/biblio/10350747}, DOI = {10.1016/j.jcrysgro.2022.126531}, abstractNote = {}, journal = {Journal of Crystal Growth}, volume = {583}, number = {C}, author = {Knipfer, B. and Xu, S. and Kirch, J.D. and Botez, D. and Mawst, L.J.}, }