Huang, Surui, Kellerk, Jack, Chen, Brian, Bharati, Aparna, Watanabe, Masashi, Cantwell, Patrick, Marvel, Chris, and Harmer, Martin. “Push-Button Microscopy”: Automated Instrument Alignment and Reciprocal-space Navigation using PyJEM. Retrieved from https://par.nsf.gov/biblio/10351759. Microscopy and Microanalysis 28.S1 Web. doi:10.1017/S1431927622011771.

Huang, Surui, Kellerk, Jack, Chen, Brian, Bharati, Aparna, Watanabe, Masashi, Cantwell, Patrick, Marvel, Chris, & Harmer, Martin. “Push-Button Microscopy”: Automated Instrument Alignment and Reciprocal-space Navigation using PyJEM. Microscopy and Microanalysis, 28 (S1). Retrieved from https://par.nsf.gov/biblio/10351759. https://doi.org/10.1017/S1431927622011771

Huang, Surui, Kellerk, Jack, Chen, Brian, Bharati, Aparna, Watanabe, Masashi, Cantwell, Patrick, Marvel, Chris, and Harmer, Martin. "“Push-Button Microscopy”: Automated Instrument Alignment and Reciprocal-space Navigation using PyJEM". Microscopy and Microanalysis 28 (S1). Country unknown/Code not available. https://doi.org/10.1017/S1431927622011771. https://par.nsf.gov/biblio/10351759.

@article{osti_10351759,
place = {Country unknown/Code not available}, title = {“Push-Button Microscopy”: Automated Instrument Alignment and Reciprocal-space Navigation using PyJEM}, url = {https://par.nsf.gov/biblio/10351759}, DOI = {10.1017/S1431927622011771}, abstractNote = {}, journal = {Microscopy and Microanalysis}, volume = {28}, number = {S1}, author = {Huang, Surui and Kellerk, Jack and Chen, Brian and Bharati, Aparna and Watanabe, Masashi and Cantwell, Patrick and Marvel, Chris and Harmer, Martin}, }