Molina-Ruiz, M., Rosen, Y. J., Jacks, H. C., Abernathy, M. R., Metcalf, T. H., Liu, X., DuBois, J. L., and Hellman, F. Origin of mechanical and dielectric losses from two-level systems in amorphous silicon. Retrieved from https://par.nsf.gov/biblio/10355820. Physical Review Materials 5.3 Web. doi:10.1103/PhysRevMaterials.5.035601.

Molina-Ruiz, M., Rosen, Y. J., Jacks, H. C., Abernathy, M. R., Metcalf, T. H., Liu, X., DuBois, J. L., & Hellman, F. Origin of mechanical and dielectric losses from two-level systems in amorphous silicon. Physical Review Materials, 5 (3). Retrieved from https://par.nsf.gov/biblio/10355820. https://doi.org/10.1103/PhysRevMaterials.5.035601

Molina-Ruiz, M., Rosen, Y. J., Jacks, H. C., Abernathy, M. R., Metcalf, T. H., Liu, X., DuBois, J. L., and Hellman, F. "Origin of mechanical and dielectric losses from two-level systems in amorphous silicon". Physical Review Materials 5 (3). Country unknown/Code not available. https://doi.org/10.1103/PhysRevMaterials.5.035601. https://par.nsf.gov/biblio/10355820.

@article{osti_10355820,
place = {Country unknown/Code not available}, title = {Origin of mechanical and dielectric losses from two-level systems in amorphous silicon}, url = {https://par.nsf.gov/biblio/10355820}, DOI = {10.1103/PhysRevMaterials.5.035601}, abstractNote = {}, journal = {Physical Review Materials}, volume = {5}, number = {3}, author = {Molina-Ruiz, M. and Rosen, Y. J. and Jacks, H. C. and Abernathy, M. R. and Metcalf, T. H. and Liu, X. and DuBois, J. L. and Hellman, F.}, }