Fortin-Deschênes, Matthieu, Pu, Rui, Zhou, Yan-Feng, Ma, Chao, Cheung, Patrick, Watanabe, Kenji, Taniguchi, Takashi, Zhang, Fan, Du, Xu, and Xia, Fengnian. Uncovering Topological Edge States in Twisted Bilayer Graphene. Retrieved from https://par.nsf.gov/biblio/10359692. Nano Letters 22.15 Web. doi:10.1021/acs.nanolett.2c01481.

Fortin-Deschênes, Matthieu, Pu, Rui, Zhou, Yan-Feng, Ma, Chao, Cheung, Patrick, Watanabe, Kenji, Taniguchi, Takashi, Zhang, Fan, Du, Xu, & Xia, Fengnian. Uncovering Topological Edge States in Twisted Bilayer Graphene. Nano Letters, 22 (15). Retrieved from https://par.nsf.gov/biblio/10359692. https://doi.org/10.1021/acs.nanolett.2c01481

Fortin-Deschênes, Matthieu, Pu, Rui, Zhou, Yan-Feng, Ma, Chao, Cheung, Patrick, Watanabe, Kenji, Taniguchi, Takashi, Zhang, Fan, Du, Xu, and Xia, Fengnian. "Uncovering Topological Edge States in Twisted Bilayer Graphene". Nano Letters 22 (15). Country unknown/Code not available. https://doi.org/10.1021/acs.nanolett.2c01481. https://par.nsf.gov/biblio/10359692.

@article{osti_10359692,
place = {Country unknown/Code not available}, title = {Uncovering Topological Edge States in Twisted Bilayer Graphene}, url = {https://par.nsf.gov/biblio/10359692}, DOI = {10.1021/acs.nanolett.2c01481}, abstractNote = {}, journal = {Nano Letters}, volume = {22}, number = {15}, author = {Fortin-Deschênes, Matthieu and Pu, Rui and Zhou, Yan-Feng and Ma, Chao and Cheung, Patrick and Watanabe, Kenji and Taniguchi, Takashi and Zhang, Fan and Du, Xu and Xia, Fengnian}, }