Scanning ultrafast electron microscopy reveals photovoltage dynamics at a deeply buried p−Si/SiO2 interface
- Award ID(s):
- 1905389
- NSF-PAR ID:
- 10359810
- Publisher / Repository:
- American Physical Society
- Date Published:
- Journal Name:
- Physical Review B
- Volume:
- 104
- Issue:
- 16
- ISSN:
- 2469-9950; PRBMDO
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation