Identifying and Measuring Security Critical Path for Uncovering Circuit Vulnerabilities
- Award ID(s):
- 1718586
- PAR ID:
- 10366188
- Date Published:
- Journal Name:
- Microprocessor Test and Verification Conference
- Page Range / eLocation ID:
- 62 to 67
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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