Clarfeld, Laurence A., Hines, Paul D. H., Hernandez, Eric M., and Eppstein, Margaret J. Risk of Cascading Blackouts Given Correlated Component Outages. IEEE Transactions on Network Science and Engineering 7.3 Web. doi:10.1109/TNSE.2019.2910837.

Clarfeld, Laurence A., Hines, Paul D. H., Hernandez, Eric M., & Eppstein, Margaret J. Risk of Cascading Blackouts Given Correlated Component Outages. IEEE Transactions on Network Science and Engineering, 7 (3). https://doi.org/10.1109/TNSE.2019.2910837

Clarfeld, Laurence A., Hines, Paul D. H., Hernandez, Eric M., and Eppstein, Margaret J. "Risk of Cascading Blackouts Given Correlated Component Outages". IEEE Transactions on Network Science and Engineering 7 (3). Country unknown/Code not available: Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/TNSE.2019.2910837. https://par.nsf.gov/biblio/10372153.

@article{osti_10372153,
place = {Country unknown/Code not available}, title = {Risk of Cascading Blackouts Given Correlated Component Outages}, url = {https://par.nsf.gov/biblio/10372153}, DOI = {10.1109/TNSE.2019.2910837}, abstractNote = {Not Available}, journal = {IEEE Transactions on Network Science and Engineering}, volume = {7}, number = {3}, publisher = {Institute of Electrical and Electronics Engineers}, author = {Clarfeld, Laurence A. and Hines, Paul D. H. and Hernandez, Eric M. and Eppstein, Margaret J.}, }