Leibovich, M., Manzorro, R., Tan, Mai, Mohan, S., Marcos-Morales, Adrià, Fernandez-Granda, C., and Crozier, P. A. Convolutional Neural Network as a Solution to Segment and Classify High Resolution TEM Images to Obtain 3D Information. Retrieved from https://par.nsf.gov/biblio/10380001. Microscopy and Microanalysis 28.S1 Web. doi:10.1017/S143192762201131X.

Leibovich, M., Manzorro, R., Tan, Mai, Mohan, S., Marcos-Morales, Adrià, Fernandez-Granda, C., & Crozier, P. A. Convolutional Neural Network as a Solution to Segment and Classify High Resolution TEM Images to Obtain 3D Information. Microscopy and Microanalysis, 28 (S1). Retrieved from https://par.nsf.gov/biblio/10380001. https://doi.org/10.1017/S143192762201131X

Leibovich, M., Manzorro, R., Tan, Mai, Mohan, S., Marcos-Morales, Adrià, Fernandez-Granda, C., and Crozier, P. A. "Convolutional Neural Network as a Solution to Segment and Classify High Resolution TEM Images to Obtain 3D Information". Microscopy and Microanalysis 28 (S1). Country unknown/Code not available. https://doi.org/10.1017/S143192762201131X. https://par.nsf.gov/biblio/10380001.

@article{osti_10380001,
place = {Country unknown/Code not available}, title = {Convolutional Neural Network as a Solution to Segment and Classify High Resolution TEM Images to Obtain 3D Information}, url = {https://par.nsf.gov/biblio/10380001}, DOI = {10.1017/S143192762201131X}, abstractNote = {}, journal = {Microscopy and Microanalysis}, volume = {28}, number = {S1}, author = {Leibovich, M. and Manzorro, R. and Tan, Mai and Mohan, S. and Marcos-Morales, Adrià and Fernandez-Granda, C. and Crozier, P. A.}, }