Sadi, Mehdi, He, Yi, Li, Yanjing, Alam, Mahabubul, Kundu, Satwik, Ghosh, Swaroop, Bahrami, Javad, and Karimi, Naghmeh. Special Session: On the Reliability of Conventional and Quantum Neural Network Hardware. Retrieved from https://par.nsf.gov/biblio/10380174. VLSI Test Symposium . Web. doi:10.1109/VTS52500.2021.9794194.
Sadi, Mehdi, He, Yi, Li, Yanjing, Alam, Mahabubul, Kundu, Satwik, Ghosh, Swaroop, Bahrami, Javad, and Karimi, Naghmeh.
"Special Session: On the Reliability of Conventional and Quantum Neural Network Hardware". VLSI Test Symposium (). Country unknown/Code not available. https://doi.org/10.1109/VTS52500.2021.9794194.https://par.nsf.gov/biblio/10380174.
@article{osti_10380174,
place = {Country unknown/Code not available},
title = {Special Session: On the Reliability of Conventional and Quantum Neural Network Hardware},
url = {https://par.nsf.gov/biblio/10380174},
DOI = {10.1109/VTS52500.2021.9794194},
abstractNote = {},
journal = {VLSI Test Symposium},
author = {Sadi, Mehdi and He, Yi and Li, Yanjing and Alam, Mahabubul and Kundu, Satwik and Ghosh, Swaroop and Bahrami, Javad and Karimi, Naghmeh},
}
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