Predicting the Cu6Sn5 Growth Kinetics During Thermal Aging of Cu-Sn Solder Joints Using Simplistic Kinetic Modeling
- Award ID(s):
- 1763128
- PAR ID:
- 10383505
- Date Published:
- Journal Name:
- Journal of Electronic Materials
- Volume:
- 51
- Issue:
- 7
- ISSN:
- 0361-5235
- Page Range / eLocation ID:
- 4063 to 4072
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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