Mutlu, Z., Lin, Y., Barin, G. B., Zhang, Z., Pitner, G., Wang, S., Darawish, R., Giovannantonio, M. Di, Wang, H., Cai, J., Passlack, M., Diaz, C. H., Narita, A., Mullen, K., Fischer, F. R., Bandaru, P., Kummel, A. C., Ruffieux, P., Fasel, R., and Bokor, J. Short-Channel Double-Gate FETs with Atomically Precise Graphene Nanoribbons. Retrieved from https://par.nsf.gov/biblio/10384105. 2021 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM) . Web. doi:10.1109/IEDM19574.2021.9720620.

Mutlu, Z., Lin, Y., Barin, G. B., Zhang, Z., Pitner, G., Wang, S., Darawish, R., Giovannantonio, M. Di, Wang, H., Cai, J., Passlack, M., Diaz, C. H., Narita, A., Mullen, K., Fischer, F. R., Bandaru, P., Kummel, A. C., Ruffieux, P., Fasel, R., & Bokor, J. Short-Channel Double-Gate FETs with Atomically Precise Graphene Nanoribbons. 2021 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM), (). Retrieved from https://par.nsf.gov/biblio/10384105. https://doi.org/10.1109/IEDM19574.2021.9720620

Mutlu, Z., Lin, Y., Barin, G. B., Zhang, Z., Pitner, G., Wang, S., Darawish, R., Giovannantonio, M. Di, Wang, H., Cai, J., Passlack, M., Diaz, C. H., Narita, A., Mullen, K., Fischer, F. R., Bandaru, P., Kummel, A. C., Ruffieux, P., Fasel, R., and Bokor, J. "Short-Channel Double-Gate FETs with Atomically Precise Graphene Nanoribbons". 2021 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM) (). Country unknown/Code not available. https://doi.org/10.1109/IEDM19574.2021.9720620. https://par.nsf.gov/biblio/10384105.

@article{osti_10384105,
place = {Country unknown/Code not available}, title = {Short-Channel Double-Gate FETs with Atomically Precise Graphene Nanoribbons}, url = {https://par.nsf.gov/biblio/10384105}, DOI = {10.1109/IEDM19574.2021.9720620}, abstractNote = {}, journal = {2021 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM)}, author = {Mutlu, Z. and Lin, Y. and Barin, G. B. and Zhang, Z. and Pitner, G. and Wang, S. and Darawish, R. and Giovannantonio, M. Di and Wang, H. and Cai, J. and Passlack, M. and Diaz, C. H. and Narita, A. and Mullen, K. and Fischer, F. R. and Bandaru, P. and Kummel, A. C. and Ruffieux, P. and Fasel, R. and Bokor, J.}, }