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Title: A Power Efficiency Metric for Comparing Energy Consumption in Future Wireless Networks in the Millimeter Wave and Terahertz bands
Future wireless cellular networks will utilize millimeter- wave and sub-THz frequencies and deploy small-cell base stations to achieve data rates on the order of hundreds of gigabits per second per user. The move to sub-THz frequencies will require attention to sustainability and reduction of power whenever possible to reduce the carbon footprint while maintaining adequate battery life for the massive number of resource-constrained devices to be deployed. This article analyzes power consumption of future wireless networks using a new metric, a figure of merit called the power waste factor (W), which shows promise for the study and development of “green G” — green technology for future wireless networks. Using W, power efficiency can be considered by quantifying the power wasted by all devices on a signal path in a cascade. We then show that the consumption efficiency factor (CEF), defined as the ratio of the maximum data rate achieved to the total power consumed, is a novel and powerful measure of power efficiency which shows that less energy per bit is expended as the cell size shrinks and carrier frequency and channel bandwidth increase. Our findings offer a standard approach to calculating and comparing power consumption and energy efficiency.  more » « less
Award ID(s):
1909206
NSF-PAR ID:
10384670
Author(s) / Creator(s):
; ; ; ; ;
Date Published:
Journal Name:
IEEE Wireless Communications
ISSN:
1536-1284
Page Range / eLocation ID:
1 to 9
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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Fig. 3(b) shows the tunneling probability T according to the Kane two-band model in the three materials, In0.53Ga0.47As, GaAs, and GaN, following our observation of a similar electroluminescence mechanism in GaN/AlN RTDs (due to strong polarization field of wurtzite structures) [8]. The expression is Tinter = (2/9)∙exp[(-2 ∙Ug 2 ∙me)/(2h∙P∙E)], where Ug is the bandgap energy, P is the valence-to-conduction-band momentum matrix element, and E is the electric field. Values for the highest calculated internal E fields for the InGaAs and GaN are also shown, indicating that Tinter in those structures approaches values of ~10-5. As shown, a GaAs RTD would require an internal field of ~6×105 V/cm, which is rarely realized in standard GaAs RTDs, perhaps explaining why there have been few if any reports of room-temperature electroluminescence in the GaAs devices. [1] E.R. Brown,et al., Appl. Phys. Lett., vol. 58, 2291, 1991. [5] S. Sze, Physics of Semiconductor Devices, 2nd Ed. 12.2.1 (Wiley, 1981). [2] M. Feiginov et al., Appl. Phys. Lett., 99, 233506, 2011. [6] L. Coldren, Diode Lasers and Photonic Integrated Circuits, (Wiley, 1995). [3] Y. Nishida et al., Nature Sci. Reports, 9, 18125, 2019. [7] E.O. Kane, J. of Appl. Phy 32, 83 (1961). [4] P. Fakhimi, et al., 2019 DRC Conference Digest. [8] T. Growden, et al., Nature Light: Science & Applications 7, 17150 (2018). [5] S. Sze, Physics of Semiconductor Devices, 2nd Ed. 12.2.1 (Wiley, 1981). [6] L. Coldren, Diode Lasers and Photonic Integrated Circuits, (Wiley, 1995). [7] E.O. Kane, J. of Appl. Phy 32, 83 (1961). [8] T. Growden, et al., Nature Light: Science & Applications 7, 17150 (2018). 
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