Liu, Liu, Sharifi, Mohammad Mehdi, Rajaei, Ramin, Kazemi, Arman, Ni, Kai, Yin, Xunzhao, Niemier, Michael, and Hu, Xiaobo Sharon. Eva-CAM: A Circuit/Architecture-Level Evaluation Tool for General Content Addressable Memories. Retrieved from https://par.nsf.gov/biblio/10385273. Design Automation and Test in Europe . Web. doi:10.23919/DATE54114.2022.9774572.

Liu, Liu, Sharifi, Mohammad Mehdi, Rajaei, Ramin, Kazemi, Arman, Ni, Kai, Yin, Xunzhao, Niemier, Michael, & Hu, Xiaobo Sharon. Eva-CAM: A Circuit/Architecture-Level Evaluation Tool for General Content Addressable Memories. Design Automation and Test in Europe, (). Retrieved from https://par.nsf.gov/biblio/10385273. https://doi.org/10.23919/DATE54114.2022.9774572

Liu, Liu, Sharifi, Mohammad Mehdi, Rajaei, Ramin, Kazemi, Arman, Ni, Kai, Yin, Xunzhao, Niemier, Michael, and Hu, Xiaobo Sharon. "Eva-CAM: A Circuit/Architecture-Level Evaluation Tool for General Content Addressable Memories". Design Automation and Test in Europe (). Country unknown/Code not available. https://doi.org/10.23919/DATE54114.2022.9774572. https://par.nsf.gov/biblio/10385273.

@article{osti_10385273,
place = {Country unknown/Code not available}, title = {Eva-CAM: A Circuit/Architecture-Level Evaluation Tool for General Content Addressable Memories}, url = {https://par.nsf.gov/biblio/10385273}, DOI = {10.23919/DATE54114.2022.9774572}, abstractNote = {}, journal = {Design Automation and Test in Europe}, author = {Liu, Liu and Sharifi, Mohammad Mehdi and Rajaei, Ramin and Kazemi, Arman and Ni, Kai and Yin, Xunzhao and Niemier, Michael and Hu, Xiaobo Sharon}, }