Nguyen, Huyen N., Abri, Faranak, Pham, Vung, Chatterjee, Moitrayee, Namin, Akbar Siami, and Dang, Tommy. MalView: Interactive Visual Analytics for Comprehending Malware Behavior. IEEE Access 10. Web. doi:10.1109/ACCESS.2022.3207782.

Nguyen, Huyen N., Abri, Faranak, Pham, Vung, Chatterjee, Moitrayee, Namin, Akbar Siami, & Dang, Tommy. MalView: Interactive Visual Analytics for Comprehending Malware Behavior. IEEE Access, 10 (). https://doi.org/10.1109/ACCESS.2022.3207782

Nguyen, Huyen N., Abri, Faranak, Pham, Vung, Chatterjee, Moitrayee, Namin, Akbar Siami, and Dang, Tommy. "MalView: Interactive Visual Analytics for Comprehending Malware Behavior". IEEE Access 10 (). Country unknown/Code not available: Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/ACCESS.2022.3207782. https://par.nsf.gov/biblio/10388656.

@article{osti_10388656,
place = {Country unknown/Code not available}, title = {MalView: Interactive Visual Analytics for Comprehending Malware Behavior}, url = {https://par.nsf.gov/biblio/10388656}, DOI = {10.1109/ACCESS.2022.3207782}, abstractNote = {Not Available}, journal = {IEEE Access}, volume = {10}, publisher = {Institute of Electrical and Electronics Engineers}, author = {Nguyen, Huyen N. and Abri, Faranak and Pham, Vung and Chatterjee, Moitrayee and Namin, Akbar Siami and Dang, Tommy}, }