Xu, Hailu, Liu, Pinchao, Guan, Boyuan, Wang, Qingyang, Da Silva, Dilma, and Hu, Liting. Achieving Online and Scalable Information Integrity by Harnessing Social Spam Correlations. IEEE Access 11. Web. doi:10.1109/ACCESS.2023.3236604.

Xu, Hailu, Liu, Pinchao, Guan, Boyuan, Wang, Qingyang, Da Silva, Dilma, & Hu, Liting. Achieving Online and Scalable Information Integrity by Harnessing Social Spam Correlations. IEEE Access, 11 (). https://doi.org/10.1109/ACCESS.2023.3236604

Xu, Hailu, Liu, Pinchao, Guan, Boyuan, Wang, Qingyang, Da Silva, Dilma, and Hu, Liting. "Achieving Online and Scalable Information Integrity by Harnessing Social Spam Correlations". IEEE Access 11 (). Country unknown/Code not available: Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/ACCESS.2023.3236604. https://par.nsf.gov/biblio/10393183.

@article{osti_10393183,
place = {Country unknown/Code not available}, title = {Achieving Online and Scalable Information Integrity by Harnessing Social Spam Correlations}, url = {https://par.nsf.gov/biblio/10393183}, DOI = {10.1109/ACCESS.2023.3236604}, abstractNote = {Not Available}, journal = {IEEE Access}, volume = {11}, publisher = {Institute of Electrical and Electronics Engineers}, author = {Xu, Hailu and Liu, Pinchao and Guan, Boyuan and Wang, Qingyang and Da Silva, Dilma and Hu, Liting}, }