De-Embedding for Coupled Three-Port Devices
- Award ID(s):
- 1916535
- NSF-PAR ID:
- 10393358
- Date Published:
- Journal Name:
- 2022 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)
- Page Range / eLocation ID:
- 742 to 745
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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Accepted Manuscript1.0
- Conference Paper:
- https://doi.org/10.1109/APEMC53576.2022.9888499
