Parker, Garrett, Kim, Samuel, Maruf, Abdullah Al, Cerny, Tomas, Frajtak, Karel, Tisnovsky, Pavel, and Taibi, Davide. Visualizing Anti-Patterns in Microservices at Runtime: A Systematic Mapping Study. IEEE Access 11. Web. doi:10.1109/ACCESS.2023.3236165.

Parker, Garrett, Kim, Samuel, Maruf, Abdullah Al, Cerny, Tomas, Frajtak, Karel, Tisnovsky, Pavel, & Taibi, Davide. Visualizing Anti-Patterns in Microservices at Runtime: A Systematic Mapping Study. IEEE Access, 11 (). https://doi.org/10.1109/ACCESS.2023.3236165

Parker, Garrett, Kim, Samuel, Maruf, Abdullah Al, Cerny, Tomas, Frajtak, Karel, Tisnovsky, Pavel, and Taibi, Davide. "Visualizing Anti-Patterns in Microservices at Runtime: A Systematic Mapping Study". IEEE Access 11 (). Country unknown/Code not available: Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/ACCESS.2023.3236165. https://par.nsf.gov/biblio/10391881.

@article{osti_10391881,
place = {Country unknown/Code not available}, title = {Visualizing Anti-Patterns in Microservices at Runtime: A Systematic Mapping Study}, url = {https://par.nsf.gov/biblio/10391881}, DOI = {10.1109/ACCESS.2023.3236165}, abstractNote = {Not Available}, journal = {IEEE Access}, volume = {11}, publisher = {Institute of Electrical and Electronics Engineers}, author = {Parker, Garrett and Kim, Samuel and Maruf, Abdullah Al and Cerny, Tomas and Frajtak, Karel and Tisnovsky, Pavel and Taibi, Davide}, }