Miniaturizing a Chip-Scale Spectrometer Using Local Strain Engineering and Total-Variation Regularized Reconstruction
- Award ID(s):
- 2143904
- PAR ID:
- 10394178
- Date Published:
- Journal Name:
- Nano Letters
- Volume:
- 22
- Issue:
- 20
- ISSN:
- 1530-6984
- Page Range / eLocation ID:
- 8174 to 8180
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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Accepted Manuscript1.0
- Journal Article:
- https://doi.org/10.1021/acs.nanolett.2c02654
