Li, Jiangshuai, Liu, Yuanzhuo, Liu, Liang, Xia, Shengxuan, Hinaga, Scott, and Khilkevich, Victor. Dielectric Loss Tangent Extraction Using Two Single-ended Striplines of Different Width. Retrieved from https://par.nsf.gov/biblio/10394657. 2022 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI) . Web. doi:10.1109/EMCSI39492.2022.9889568.

Li, Jiangshuai, Liu, Yuanzhuo, Liu, Liang, Xia, Shengxuan, Hinaga, Scott, & Khilkevich, Victor. Dielectric Loss Tangent Extraction Using Two Single-ended Striplines of Different Width. 2022 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI), (). Retrieved from https://par.nsf.gov/biblio/10394657. https://doi.org/10.1109/EMCSI39492.2022.9889568

Li, Jiangshuai, Liu, Yuanzhuo, Liu, Liang, Xia, Shengxuan, Hinaga, Scott, and Khilkevich, Victor. "Dielectric Loss Tangent Extraction Using Two Single-ended Striplines of Different Width". 2022 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI) (). Country unknown/Code not available. https://doi.org/10.1109/EMCSI39492.2022.9889568. https://par.nsf.gov/biblio/10394657.

@article{osti_10394657,
place = {Country unknown/Code not available}, title = {Dielectric Loss Tangent Extraction Using Two Single-ended Striplines of Different Width}, url = {https://par.nsf.gov/biblio/10394657}, DOI = {10.1109/EMCSI39492.2022.9889568}, abstractNote = {}, journal = {2022 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)}, author = {Li, Jiangshuai and Liu, Yuanzhuo and Liu, Liang and Xia, Shengxuan and Hinaga, Scott and Khilkevich, Victor}, }