Gomez, Roderick A., Christian, Shamar F., Oggier, German G., Fantino, Roberto A., Balda, Juan C., and Zhao, Yue. Etching Process to Reduce Interlamination Short Circuits and Core Loss Comparison for Tape-Wound Cut Cores. Retrieved from https://par.nsf.gov/biblio/10396161. 2022 IEEE 13th International Symposium on Power Electronics for Distributed Generation Systems (PEDG) . Web. doi:10.1109/PEDG54999.2022.9923076.

Gomez, Roderick A., Christian, Shamar F., Oggier, German G., Fantino, Roberto A., Balda, Juan C., & Zhao, Yue. Etching Process to Reduce Interlamination Short Circuits and Core Loss Comparison for Tape-Wound Cut Cores. 2022 IEEE 13th International Symposium on Power Electronics for Distributed Generation Systems (PEDG), (). Retrieved from https://par.nsf.gov/biblio/10396161. https://doi.org/10.1109/PEDG54999.2022.9923076

Gomez, Roderick A., Christian, Shamar F., Oggier, German G., Fantino, Roberto A., Balda, Juan C., and Zhao, Yue. "Etching Process to Reduce Interlamination Short Circuits and Core Loss Comparison for Tape-Wound Cut Cores". 2022 IEEE 13th International Symposium on Power Electronics for Distributed Generation Systems (PEDG) (). Country unknown/Code not available. https://doi.org/10.1109/PEDG54999.2022.9923076. https://par.nsf.gov/biblio/10396161.

@article{osti_10396161,
place = {Country unknown/Code not available}, title = {Etching Process to Reduce Interlamination Short Circuits and Core Loss Comparison for Tape-Wound Cut Cores}, url = {https://par.nsf.gov/biblio/10396161}, DOI = {10.1109/PEDG54999.2022.9923076}, abstractNote = {}, journal = {2022 IEEE 13th International Symposium on Power Electronics for Distributed Generation Systems (PEDG)}, author = {Gomez, Roderick A. and Christian, Shamar F. and Oggier, German G. and Fantino, Roberto A. and Balda, Juan C. and Zhao, Yue}, }