LeBlanc, Sam, Church, Kenneth, Rojas-Nastrucci, Eduardo A., Martinez-de-Rioja, Eduardo, Carrasco, Eduardo, and Encinar, Jose A. Advanced Manufacturing and Characterization of mm-Wave Two-Layer Reflectarray Cells. Retrieved from https://par.nsf.gov/biblio/10399978. 2022 IEEE 22nd Annual Wireless and Microwave Technology Conference (WAMICON) . Web. doi:10.1109/WAMICON53991.2022.9786075.

LeBlanc, Sam, Church, Kenneth, Rojas-Nastrucci, Eduardo A., Martinez-de-Rioja, Eduardo, Carrasco, Eduardo, & Encinar, Jose A. Advanced Manufacturing and Characterization of mm-Wave Two-Layer Reflectarray Cells. 2022 IEEE 22nd Annual Wireless and Microwave Technology Conference (WAMICON), (). Retrieved from https://par.nsf.gov/biblio/10399978. https://doi.org/10.1109/WAMICON53991.2022.9786075

LeBlanc, Sam, Church, Kenneth, Rojas-Nastrucci, Eduardo A., Martinez-de-Rioja, Eduardo, Carrasco, Eduardo, and Encinar, Jose A. "Advanced Manufacturing and Characterization of mm-Wave Two-Layer Reflectarray Cells". 2022 IEEE 22nd Annual Wireless and Microwave Technology Conference (WAMICON) (). Country unknown/Code not available. https://doi.org/10.1109/WAMICON53991.2022.9786075. https://par.nsf.gov/biblio/10399978.

@article{osti_10399978,
place = {Country unknown/Code not available}, title = {Advanced Manufacturing and Characterization of mm-Wave Two-Layer Reflectarray Cells}, url = {https://par.nsf.gov/biblio/10399978}, DOI = {10.1109/WAMICON53991.2022.9786075}, abstractNote = {}, journal = {2022 IEEE 22nd Annual Wireless and Microwave Technology Conference (WAMICON)}, author = {LeBlanc, Sam and Church, Kenneth and Rojas-Nastrucci, Eduardo A. and Martinez-de-Rioja, Eduardo and Carrasco, Eduardo and Encinar, Jose A.}, }