Bonagiri, Lalith Krishna, Panse, Kaustubh S., Zhou, Shan, Wu, Haiyi, Aluru, Narayana R., and Zhang, Yingjie. Real-Space Charge Density Profiling of Electrode–Electrolyte Interfaces with Angstrom Depth Resolution. Retrieved from https://par.nsf.gov/biblio/10401414. ACS Nano 16.11 Web. doi:10.1021/acsnano.2c10819.

Bonagiri, Lalith Krishna, Panse, Kaustubh S., Zhou, Shan, Wu, Haiyi, Aluru, Narayana R., & Zhang, Yingjie. Real-Space Charge Density Profiling of Electrode–Electrolyte Interfaces with Angstrom Depth Resolution. ACS Nano, 16 (11). Retrieved from https://par.nsf.gov/biblio/10401414. https://doi.org/10.1021/acsnano.2c10819

Bonagiri, Lalith Krishna, Panse, Kaustubh S., Zhou, Shan, Wu, Haiyi, Aluru, Narayana R., and Zhang, Yingjie. "Real-Space Charge Density Profiling of Electrode–Electrolyte Interfaces with Angstrom Depth Resolution". ACS Nano 16 (11). Country unknown/Code not available. https://doi.org/10.1021/acsnano.2c10819. https://par.nsf.gov/biblio/10401414.

@article{osti_10401414,
place = {Country unknown/Code not available}, title = {Real-Space Charge Density Profiling of Electrode–Electrolyte Interfaces with Angstrom Depth Resolution}, url = {https://par.nsf.gov/biblio/10401414}, DOI = {10.1021/acsnano.2c10819}, abstractNote = {}, journal = {ACS Nano}, volume = {16}, number = {11}, author = {Bonagiri, Lalith Krishna and Panse, Kaustubh S. and Zhou, Shan and Wu, Haiyi and Aluru, Narayana R. and Zhang, Yingjie}, }