Liu, Shouzheng, Kotta, Erica, Xu, Yishuai, Mutch, Joshua, Chu, Jiun-Haw, Hoesch, Moritz, Mahatha, Sanjoy Kr, Denlinger, Jonathan D., and Wray, L. Andrew. Fourier-based methods for removing mesh anomalies from angle resolved photoemission spectra. Retrieved from https://par.nsf.gov/biblio/10405432. Journal of Electron Spectroscopy and Related Phenomena 260.C Web. doi:10.1016/j.elspec.2022.147255.

Liu, Shouzheng, Kotta, Erica, Xu, Yishuai, Mutch, Joshua, Chu, Jiun-Haw, Hoesch, Moritz, Mahatha, Sanjoy Kr, Denlinger, Jonathan D., & Wray, L. Andrew. Fourier-based methods for removing mesh anomalies from angle resolved photoemission spectra. Journal of Electron Spectroscopy and Related Phenomena, 260 (C). Retrieved from https://par.nsf.gov/biblio/10405432. https://doi.org/10.1016/j.elspec.2022.147255

Liu, Shouzheng, Kotta, Erica, Xu, Yishuai, Mutch, Joshua, Chu, Jiun-Haw, Hoesch, Moritz, Mahatha, Sanjoy Kr, Denlinger, Jonathan D., and Wray, L. Andrew. "Fourier-based methods for removing mesh anomalies from angle resolved photoemission spectra". Journal of Electron Spectroscopy and Related Phenomena 260 (C). Country unknown/Code not available. https://doi.org/10.1016/j.elspec.2022.147255. https://par.nsf.gov/biblio/10405432.

@article{osti_10405432,
place = {Country unknown/Code not available}, title = {Fourier-based methods for removing mesh anomalies from angle resolved photoemission spectra}, url = {https://par.nsf.gov/biblio/10405432}, DOI = {10.1016/j.elspec.2022.147255}, abstractNote = {}, journal = {Journal of Electron Spectroscopy and Related Phenomena}, volume = {260}, number = {C}, author = {Liu, Shouzheng and Kotta, Erica and Xu, Yishuai and Mutch, Joshua and Chu, Jiun-Haw and Hoesch, Moritz and Mahatha, Sanjoy Kr and Denlinger, Jonathan D. and Wray, L. Andrew}, }