Two-dimensional electron gas (2DEG) states at oxide interfaces between two ferroic materials have been fertile ground to realize controllable multiferroicity. Here, we investigate the 2DEG states at the interface of ferroelectric BaTiO3 and a magnetic layer of iron using angle-resolved photoemission spectroscopy. Orbital-selective charge transfer occurs on the surprisingly robust 2DEG. Based on first-principles calculations, we show how the interfacial hybridization can give rise to the unexpected charge transfer in the magnetic 2DEG. Our study reveals a close interplay on a 2DEG between magnetic and ferroelectric interfaces, which sheds light on future design principles of multiferroic 2DEG states.
more »
« less
Direct observation of polarization-induced two-dimensional electron/hole gases at ferroelectric-insulator interface
Abstract Two-dimensional electron gas or hole gas (2DEG or 2DHG) and their functionalities at artificial heterostructure interfaces have attracted extensive attention in recent years. Many theoretical calculations and recent experimental studies have shown the formation of alternating 2DEG and 2DHG at ferroelectric/insulator interfaces, such as BiFeO 3 /TbScO 3 , depending on the different polarization states. However, a direct observation based on the local charge distribution at the BiFeO 3 /TbScO 3 interface has yet to be explored. Herein we demonstrate the direct observation of 2DHG and 2DEG at BiFeO 3 /TbScO 3 interface using four-dimensional scanning transmission electron microscopy and Bader charge analysis. The results show that the measured charge state of each Fe/O columns at the interface undergoes a significant increase/reduction for the polarization state pointing away/toward the interface, indicating the existence of 2DHG/2DEG. This method opens up a path of directly observing charge at atomic scale and provides new insights into the design of future electronic nanodevices.
more »
« less
- Award ID(s):
- 2034738
- PAR ID:
- 10405792
- Date Published:
- Journal Name:
- npj Quantum Materials
- Volume:
- 6
- Issue:
- 1
- ISSN:
- 2397-4648
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
More Like this
-
-
The properties of a two-dimensional electron gas (2DEG) in a semiconductor host with two valleys related by an underlying C4 rotational symmetry are studied using Hartree-Fock and various other many-body approaches. A familiar artifact of the HF approach is a degeneracy between the valley-polarized-"Ising nematic"-and spin-polarized-ferromagnetic-phases, which is inconsistent with recent variational Monte Carlo (VMC) results. Correlation effects, computed either within the random phase approximation (RPA) or the T-matrix approximation, enhance the valley susceptibility relative to the spin susceptibility. Extrapolating the results to finite interaction strength, we find a direct first-order transition from a symmetry-unbroken state to a spinunpolarized Ising nematic fluid with full valley polarization, in qualitative agreement with VMC. The RPA results are also reminiscent of experiments on the corresponding 2DEG in AlAs heterostructures.more » « less
-
Interfacial charge transfer and its impact on transport properties of LaNiO 3 /LaFeO 3 superlatticesCharge transfer or redistribution at oxide heterointerfaces is a critical phenomenon, often leading to remarkable properties such as two-dimensional electron gas and interfacial ferromagnetism. Despite studies on LaNiO3/LaFeO3superlattices and heterostructures, the direction and magnitude of the charge transfer remain debated, with some suggesting no charge transfer due to the high stability of Fe3+(3d5). Here, we synthesized a series of epitaxial LaNiO3/LaFeO3superlattices and demonstrated partial (up to ~0.5 e−/interface unit cell) charge transfer from Fe to Ni near the interface, supported by density functional theory simulations and spectroscopic evidence of changes in Ni and Fe oxidation states. The electron transfer from LaFeO3to LaNiO3and the subsequent rearrangement of the Fe 3d band create an unexpected metallic ground state within the LaFeO3layer, strongly influencing the in-plane transport properties across the superlattice. Moreover, we establish a direct correlation between interfacial charge transfer and in-plane electrical transport properties, providing insights for designing functional oxide heterostructures with emerging properties.more » « less
-
We report the electrical properties of Al0.3Ga0.7N/GaN heterojunction field effect transistor (HFET) structures with a Ga2O3 passivation layer grown by metal–organic chemical vapor deposition (MOCVD). In this study, three different thicknesses of β-Ga2O3 dielectric layers were grown on Al0.3Ga0.7N/GaN structures leading to metal-oxide-semiconductor-HFET or MOSHFET structures. X-ray diffraction (XRD) showed the (2¯01) orientation peaks of β-Ga2O3 in the device structure. The van der Pauw and Hall measurements yield the electron density of ~ 4 × 1018 cm−3 and mobility of ~770 cm2V−1s−1 in the 2-dimensional electron gas (2DEG) channel at room temperature. Capacitance–voltage (C-V) measurement for the on-state 2DEG density for the MOSHFET structure was found to be of the order of ~1.5 × 1013 cm−2. The thickness of the Ga2O3 layer was inversely related to the threshold voltage and the on-state capacitance. The interface charge density between the oxide and Al0.3Ga0.7N barrier layer was found to be of the order of ~1012 cm2eV−1. A significant reduction in leakage current from ~10−4 A/cm2 for HFET to ~10−6 A/cm2 for MOSHFET was observed well beyond pinch-off in the off-stage at -20 V applied gate voltage. The annealing at 900° C of the MOSHFET structures revealed that the Ga2O3 layer was thermally stable at high temperatures resulting in insignificant threshold voltage shifts for annealed samples with respect to as-deposited (unannealed) structures. Our results show that the MOCVD-gown Ga2O3 dielectric layers can be a strong candidate for stable high-power devices.more » « less
-
Abstract A BiFeO3film is grown epitaxially on a PrScO3single crystal substrate which imparts ~ 1.45% of biaxial tensile strain to BiFeO3resulting from lattice misfit. The biaxial tensile strain effect on BiFeO3is investigated in terms of crystal structure, Poisson ratio, and ferroelectric domain structure. Lattice resolution scanning transmission electron microscopy, precession electron diffraction, and X-ray diffraction results clearly show that in-plane interplanar distance of BiFeO3is the same as that of PrScO3with no sign of misfit dislocations, indicating that the biaxial tensile strain caused by lattice mismatch between BiFeO3and PrScO3are stored as elastic energy within BiFeO3film. Nano-beam electron diffraction patterns compared with structure factor calculation found that the BiFeO3maintains rhombohedral symmetry, i.e., space group ofR3c. The pattern analysis also revealed two crystallographically distinguishable domains. Their relations with ferroelectric domain structures in terms of size and spontaneous polarization orientations within the domains are further understood using four-dimensional scanning transmission electron microscopy technique.more » « less
An official website of the United States government

