Selhorst, Ryan, Susner, Michael A., Muzzio, Ryan, Kao, I-Hsuan, Carpena-Núñez, Jennifer, Islam, Ahmad E., Katoch, Jyoti, Maruyama, Benji, and Rao, Rahul. Electron-beam chemistry in graphene - Effect of environmental SEM parameters on patterning and defect engineering. Retrieved from https://par.nsf.gov/biblio/10412043. Vacuum 207.C Web. doi:10.1016/j.vacuum.2022.111686.

Selhorst, Ryan, Susner, Michael A., Muzzio, Ryan, Kao, I-Hsuan, Carpena-Núñez, Jennifer, Islam, Ahmad E., Katoch, Jyoti, Maruyama, Benji, & Rao, Rahul. Electron-beam chemistry in graphene - Effect of environmental SEM parameters on patterning and defect engineering. Vacuum, 207 (C). Retrieved from https://par.nsf.gov/biblio/10412043. https://doi.org/10.1016/j.vacuum.2022.111686

Selhorst, Ryan, Susner, Michael A., Muzzio, Ryan, Kao, I-Hsuan, Carpena-Núñez, Jennifer, Islam, Ahmad E., Katoch, Jyoti, Maruyama, Benji, and Rao, Rahul. "Electron-beam chemistry in graphene - Effect of environmental SEM parameters on patterning and defect engineering". Vacuum 207 (C). Country unknown/Code not available. https://doi.org/10.1016/j.vacuum.2022.111686. https://par.nsf.gov/biblio/10412043.

@article{osti_10412043,
place = {Country unknown/Code not available}, title = {Electron-beam chemistry in graphene - Effect of environmental SEM parameters on patterning and defect engineering}, url = {https://par.nsf.gov/biblio/10412043}, DOI = {10.1016/j.vacuum.2022.111686}, abstractNote = {}, journal = {Vacuum}, volume = {207}, number = {C}, author = {Selhorst, Ryan and Susner, Michael A. and Muzzio, Ryan and Kao, I-Hsuan and Carpena-Núñez, Jennifer and Islam, Ahmad E. and Katoch, Jyoti and Maruyama, Benji and Rao, Rahul}, }