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Title: A Natural Organic Artificial Synaptic Device Made from a Honey and Carbon Nanotube Admixture for Neuromorphic Computing
Abstract

Artificial synaptic devices are the essential hardware component in emerging neuromorphic computing systems by mimicking biological synapse and brain functions. When made from natural organic materials such as protein and carbohydrate, they have potential to improve sustainability and reduce electronic waste by enabling environmentally‐friendly disposal. In this paper, a new natural organic memristor based artificial synaptic device is reported with the memristive film processed by a honey and carbon nanotube (CNT) admixture, that is, honey‐CNT memristor. Optical microscopy, scanning electron microscopy, and micro‐Raman spectroscopy are employed to analyze the morphology and chemical structure of the honey‐CNT film. The device demonstrates analog memristive potentiation and depression, with the mechanism governing these functions explained by the formation and dissolution of conductive paths due to the electrochemical metal filaments which are assisted by CNT clusters and bundles in the honey‐CNT film. The honey‐CNT memristor successfully emulates synaptic functionalities such as short‐term plasticity and its transition to long‐term plasticity for memory rehearsal, spatial summation, and shunting inhibition, and for the first time, the classical conditioning behavior for associative learning by mimicking the Pavlov's dog experiment. All these results testify that honey‐CNT memristor based artificial synaptic device is promising for energy‐efficient and eco‐friendly neuromorphic systems.

 
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Award ID(s):
2104976
NSF-PAR ID:
10419267
Author(s) / Creator(s):
 ;  ;  ;  ;  
Publisher / Repository:
Wiley Blackwell (John Wiley & Sons)
Date Published:
Journal Name:
Advanced Materials Technologies
Volume:
8
Issue:
14
ISSN:
2365-709X
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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    The memristor has sparked tremendous interest due to its simple two-terminal structure, including top electrode (TE), bottom electrode (BE), and an intermediate resistive switching (RS) layer. Many oxide materials, including HfO2, Ta2O5, and IGZO, have extensively been studied as an RS layer of memristors. Silicon dioxide (SiO2) features 3D structural conformity with the conventional CMOS technology and high wafer-scale homogeneity, which has benefited modern microelectronic devices as dielectric and/or passivation layers. Therefore, the use of SiO2as a memristor RS layer for neuromorphic computing is expected to be compatible with current Si technology with minimal processing and material-related complexities.

    In this work, we proposed SiO2-based memristor and investigated switching behaviors metallized with different reduction potentials by applying pure Cu and Ag, and their alloys with varied ratios. Heavily doped p-type silicon was chosen as BE in order to exclude any effects of the BE ions on the memristor performance. We previously reported that the selection of TE is crucial for achieving a high memory window and stable switching performance. According to the study which compares the roles of Cu (switching stabilizer) and Ag (large switching window performer) TEs for oxide memristors, we have selected the TE materials and their alloys to engineer the SiO2-based memristor characteristics. The Ag TE leads to a larger memory window of the SiO2memristor, but the device shows relatively large variation and less reliability. On the other hand, the Cu TE device presents uniform gradual switching behavior which is in line with our previous report that Cu can be served as a stabilizer, but with small on/off ratio.[9] These distinct performances with Cu and Ag metallization leads us to utilize a Cu/Ag alloy as the TE. Various compositions of Cu/Ag were examined for the optimization of the memristor TEs. With a Cu/Ag alloying TE with optimized ratio, our SiO2based memristor demonstrates uniform switching behavior and memory window for analog switching applications. Also, it shows ideal potentiation and depression synaptic behavior under the positive/negative spikes (pulse train).

    In conclusion, the SiO2memristors with different metallization were established. To tune the property of RS layer, the sputtering conditions of RS were varied. To investigate the influence of TE selections on switching performance of memristor, we integrated Cu, Ag and Cu/Ag alloy as TEs and compared the switch characteristics. Our encouraging results clearly demonstrate that SiO2with Cu/Ag is a promising memristor device with synaptic switching behavior in neuromorphic computing applications.

    Acknowledgement

    This work was supported by the U.S. National Science Foundation (NSF) Award No. ECCS-1931088. S.L. and H.W.S. acknowledge the support from the Improvement of Measurement Standards and Technology for Mechanical Metrology (Grant No. 22011044) by KRISS.

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