Copley, J. A., Ellyson, B., Klemm-Toole, J., Gao, J., Kedir, N., Kirk, C., Chen, W., Parab, N., Sun, T., Fezzaa, K., Clarke, K., and Clarke, A. J. Considerations of Sample Thickness and Detector Placement in Intensity Limited Polychromatic X-Ray Diffraction Experiments. Retrieved from https://par.nsf.gov/biblio/10420180. Journal of Dynamic Behavior of Materials 8.4 Web. doi:10.1007/s40870-022-00345-8.

Copley, J. A., Ellyson, B., Klemm-Toole, J., Gao, J., Kedir, N., Kirk, C., Chen, W., Parab, N., Sun, T., Fezzaa, K., Clarke, K., & Clarke, A. J. Considerations of Sample Thickness and Detector Placement in Intensity Limited Polychromatic X-Ray Diffraction Experiments. Journal of Dynamic Behavior of Materials, 8 (4). Retrieved from https://par.nsf.gov/biblio/10420180. https://doi.org/10.1007/s40870-022-00345-8

Copley, J. A., Ellyson, B., Klemm-Toole, J., Gao, J., Kedir, N., Kirk, C., Chen, W., Parab, N., Sun, T., Fezzaa, K., Clarke, K., and Clarke, A. J. "Considerations of Sample Thickness and Detector Placement in Intensity Limited Polychromatic X-Ray Diffraction Experiments". Journal of Dynamic Behavior of Materials 8 (4). Country unknown/Code not available. https://doi.org/10.1007/s40870-022-00345-8. https://par.nsf.gov/biblio/10420180.

@article{osti_10420180,
place = {Country unknown/Code not available}, title = {Considerations of Sample Thickness and Detector Placement in Intensity Limited Polychromatic X-Ray Diffraction Experiments}, url = {https://par.nsf.gov/biblio/10420180}, DOI = {10.1007/s40870-022-00345-8}, abstractNote = {}, journal = {Journal of Dynamic Behavior of Materials}, volume = {8}, number = {4}, author = {Copley, J. A. and Ellyson, B. and Klemm-Toole, J. and Gao, J. and Kedir, N. and Kirk, C. and Chen, W. and Parab, N. and Sun, T. and Fezzaa, K. and Clarke, K. and Clarke, A. J.}, }