Lozovoi, Artur, Chen, YunHeng, Vizkelethy, Gyorgy, Bielejec, Edward, Flick, Johannes, Doherty, Marcus W., and Meriles, Carlos A. Detection and Modeling of Hole Capture by Single Point Defects under Variable Electric Fields. Retrieved from https://par.nsf.gov/biblio/10422865. Nano Letters 23.10 Web. doi:10.1021/acs.nanolett.3c00860.

Lozovoi, Artur, Chen, YunHeng, Vizkelethy, Gyorgy, Bielejec, Edward, Flick, Johannes, Doherty, Marcus W., & Meriles, Carlos A. Detection and Modeling of Hole Capture by Single Point Defects under Variable Electric Fields. Nano Letters, 23 (10). Retrieved from https://par.nsf.gov/biblio/10422865. https://doi.org/10.1021/acs.nanolett.3c00860

Lozovoi, Artur, Chen, YunHeng, Vizkelethy, Gyorgy, Bielejec, Edward, Flick, Johannes, Doherty, Marcus W., and Meriles, Carlos A. "Detection and Modeling of Hole Capture by Single Point Defects under Variable Electric Fields". Nano Letters 23 (10). Country unknown/Code not available. https://doi.org/10.1021/acs.nanolett.3c00860. https://par.nsf.gov/biblio/10422865.

@article{osti_10422865,
place = {Country unknown/Code not available}, title = {Detection and Modeling of Hole Capture by Single Point Defects under Variable Electric Fields}, url = {https://par.nsf.gov/biblio/10422865}, DOI = {10.1021/acs.nanolett.3c00860}, abstractNote = {}, journal = {Nano Letters}, volume = {23}, number = {10}, author = {Lozovoi, Artur and Chen, YunHeng and Vizkelethy, Gyorgy and Bielejec, Edward and Flick, Johannes and Doherty, Marcus W. and Meriles, Carlos A.}, }