Experimental evaluation of simulated quantum annealing with MTJ-augmented p-bits (Conference Paper) | NSF PAGES

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Citation Details

Experimental evaluation of simulated quantum annealing with MTJ-augmented p-bits

Award ID(s):: 2106260

NSF-PAR ID:: 10424754

Author(s) / Creator(s):: Aadit N. A.; Kobayashi, K.; Cao, Q.; Chowdhury, S; Finocchio, G.; Kanai, S.; Ohno, H; Fukami, S; Camsari, K. Y.

Date Published:: 2022-01-01

Journal Name:: 2022 International Electron Devices Meeting (IEDM)

Format(s):: Medium: X

Sponsoring Org:: National Science Foundation

Free Publicly Accessible Full Text
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Conference Paper:
The DOI is not currently available.