Shoff, Thomas A., and Julian, Ryan R. Fragment Ion Abundance Reveals Information about Structure and Charge Localization in Highly Charged Proteins. Journal of the American Society for Mass Spectrometry 34.8 Web. doi:10.1021/jasms.3c00196.

Shoff, Thomas A., & Julian, Ryan R. Fragment Ion Abundance Reveals Information about Structure and Charge Localization in Highly Charged Proteins. Journal of the American Society for Mass Spectrometry, 34 (8). https://doi.org/10.1021/jasms.3c00196

Shoff, Thomas A., and Julian, Ryan R. "Fragment Ion Abundance Reveals Information about Structure and Charge Localization in Highly Charged Proteins". Journal of the American Society for Mass Spectrometry 34 (8). Country unknown/Code not available: American Chemical Society. https://doi.org/10.1021/jasms.3c00196. https://par.nsf.gov/biblio/10433895.

@article{osti_10433895,
place = {Country unknown/Code not available}, title = {Fragment Ion Abundance Reveals Information about Structure and Charge Localization in Highly Charged Proteins}, url = {https://par.nsf.gov/biblio/10433895}, DOI = {10.1021/jasms.3c00196}, abstractNote = {Not Available}, journal = {Journal of the American Society for Mass Spectrometry}, volume = {34}, number = {8}, publisher = {American Chemical Society}, author = {Shoff, Thomas A. and Julian, Ryan R.}, }