Hathaway, Evan, Gonzalez Rodriguez, Roberto, Lin, Yuankun, and Cui, Jingbiao. Elucidating the Degradation Mechanisms in Silicon Telluride through Multimodal Characterization. Retrieved from https://par.nsf.gov/biblio/10438152. The Journal of Physical Chemistry C 127.28 Web. doi:10.1021/acs.jpcc.3c01864.

Hathaway, Evan, Gonzalez Rodriguez, Roberto, Lin, Yuankun, & Cui, Jingbiao. Elucidating the Degradation Mechanisms in Silicon Telluride through Multimodal Characterization. The Journal of Physical Chemistry C, 127 (28). Retrieved from https://par.nsf.gov/biblio/10438152. https://doi.org/10.1021/acs.jpcc.3c01864

Hathaway, Evan, Gonzalez Rodriguez, Roberto, Lin, Yuankun, and Cui, Jingbiao. "Elucidating the Degradation Mechanisms in Silicon Telluride through Multimodal Characterization". The Journal of Physical Chemistry C 127 (28). Country unknown/Code not available. https://doi.org/10.1021/acs.jpcc.3c01864. https://par.nsf.gov/biblio/10438152.

@article{osti_10438152,
place = {Country unknown/Code not available}, title = {Elucidating the Degradation Mechanisms in Silicon Telluride through Multimodal Characterization}, url = {https://par.nsf.gov/biblio/10438152}, DOI = {10.1021/acs.jpcc.3c01864}, abstractNote = {}, journal = {The Journal of Physical Chemistry C}, volume = {127}, number = {28}, author = {Hathaway, Evan and Gonzalez Rodriguez, Roberto and Lin, Yuankun and Cui, Jingbiao}, }