Koppell, Stewart A., Simonaitis, John W., Krielaart, Maurice A.R., Ates, Omer E., Putnam, William P., Berggren, Karl K., and Keathley, Phillip. D. Applications in Microscopy and Lithography for a Heralded Electron Source. Retrieved from https://par.nsf.gov/biblio/10438553. 2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC) . Web. doi:10.1109/IVNC57695.2023.10188972.

Koppell, Stewart A., Simonaitis, John W., Krielaart, Maurice A.R., Ates, Omer E., Putnam, William P., Berggren, Karl K., & Keathley, Phillip. D. Applications in Microscopy and Lithography for a Heralded Electron Source. 2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC), (). Retrieved from https://par.nsf.gov/biblio/10438553. https://doi.org/10.1109/IVNC57695.2023.10188972

Koppell, Stewart A., Simonaitis, John W., Krielaart, Maurice A.R., Ates, Omer E., Putnam, William P., Berggren, Karl K., and Keathley, Phillip. D. "Applications in Microscopy and Lithography for a Heralded Electron Source". 2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC) (). Country unknown/Code not available. https://doi.org/10.1109/IVNC57695.2023.10188972. https://par.nsf.gov/biblio/10438553.

@article{osti_10438553,
place = {Country unknown/Code not available}, title = {Applications in Microscopy and Lithography for a Heralded Electron Source}, url = {https://par.nsf.gov/biblio/10438553}, DOI = {10.1109/IVNC57695.2023.10188972}, abstractNote = {}, journal = {2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC)}, author = {Koppell, Stewart A. and Simonaitis, John W. and Krielaart, Maurice A.R. and Ates, Omer E. and Putnam, William P. and Berggren, Karl K. and Keathley, Phillip. D.}, }