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   https://doi.org/10.1109/IVNC57695.2023.10188999  

   Simonaitis, John W. ; Krielaart, Maurice A. ; Koppell, Stewart A. ; Slayton, Benjamin J. ; Alongi, Joseph ; Putnam, William P. ; Berggren, Karl K. ; Keathley, Phillip D. ( July 2023 , 2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC))
2. Secondary Electron Count Imaging in a Scanning Electron Microscope

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3. A simple one-electron expression for electron rotational factors

   https://doi.org/10.1063/5.0192083  

   Qiu, Tian ; Bhati, Mansi ; Tao, Zhen ; Bian, Xuezhi ; Rawlinson, Jonathan ; Littlejohn, Robert G ; Subotnik, Joseph E ( March 2024 , The Journal of Chemical Physics)

   Within the context of fewest-switch surface hopping (FSSH) dynamics, one often wishes to remove the angular component of the derivative coupling between states J and K. In a previous set of papers, Shu et al. [J. Phys. Chem. Lett. 11, 1135–1140 (2020)] posited one approach for such a removal based on direct projection, while we isolated a second approach by constructing and differentiating a rotationally invariant basis. Unfortunately, neither approach was able to demonstrate a one-electron operatorÔ whose matrix element JÔK was the angular component of the derivative coupling. Here, we show that a one-electron operator can, in fact, be constructed efficiently in a semi-local fashion. The present results yield physical insight into designing new surface hopping algorithms and are of immediate use for FSSH calculations.

    

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4. Applicability of Eliashberg theory for systems with electron-phonon and electron-electron interaction: A comparative analysis

   https://doi.org/10.1103/PhysRevB.109.245132  

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5. Transient lensing from a photoemitted electron gas imaged by ultrafast electron microscopy

   https://doi.org/10.1038/s41467-020-16746-z  

   Zandi, Omid ; Sykes, Allan E. ; Cornelius, Ryan D. ; Alcorn, Francis M. ; Zerbe, Brandon S. ; Duxbury, Phillip M. ; Reed, Bryan W. ; van der Veen, Renske M. ( December 2020 , Nature Communications)