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The emergence of embedded magnetic random-access memory (MRAM) and its integration in mainstream semiconductor manufacturing technology have created an unprecedented opportunity for engineering computing systems with improved performance, energy efficiency, lower cost, and unconventional computing capabilities. While the initial interest in the existing generation of MRAM—which is based on the spin-transfer torque (STT) effect in ferromagnetic tunnel junctions—was driven by its nonvolatile data retention and lower cost of integration compared to embedded Flash (eFlash), the focus of MRAM research and development efforts is increasingly shifting toward alternative write mechanisms (beyond STT) and new materials (beyond ferromagnets) in recent years. This has been driven by the need for better speed vs density and speed vs endurance trade-offs to make MRAM applicable to a wider range of memory markets, as well as to utilize the potential of MRAM in various unconventional computing architectures that utilize the physics of nanoscale magnets. In this Perspective, we offer an overview of spin–orbit torque (SOT) as one of these beyond-STT write mechanisms for the MRAM devices. We discuss, specifically, the progress in developing SOT-MRAM devices with perpendicular magnetization. Starting from basic symmetry considerations, we discuss the requirement for an in-plane bias magnetic field which has hindered progress in developing practical SOT-MRAM devices. We then discuss several approaches based on structural, magnetic, and chiral symmetry-breaking that have been explored to overcome this limitation and realize bias-field-free SOT-MRAM devices with perpendicular magnetization. We also review the corresponding material- and device-level challenges in each case. We then present a perspective of the potential of these devices for computing and security applications beyond their use in the conventional memory hierarchy.
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Progress and Application Perspectives of Voltage‐Controlled Magnetic Tunnel Junctions
Abstract This article discusses the current state of development, open research opportunities, and application perspectives of electric‐field‐controlled magnetic tunnel junctions that use the voltage‐controlled magnetic anisotropy effect to control their magnetization. The integration of embedded magnetic random‐access memory (MRAM) into mainstream semiconductor foundry manufacturing opens new possibilities for the development of energy‐efficient, high‐performance, and intelligent computing systems. The current generation of MRAM, which uses the current‐controlled spin‐transfer torque (STT) effect to write information, has gained traction due to its nonvolatile data retention and lower integration cost compared to embedded Flash. However, scaling MRAM to high bit densities will likely require a transition from current‐controlled to voltage‐controlled operation. In this perspective, an overview of voltage‐controlled magnetic anisotropy (VCMA) as a promising beyond‐STT write mechanism for MRAM devices is provided and recent advancements in developing VCMA‐MRAM devices with perpendicular magnetization are highlighted. Starting from the fundamental mechanisms, the key remaining challenges of VCMA‐MRAM, such as increasing the VCMA coefficient, controlling the write error rate, and achieving field‐free VCMA switching are discussed. Then potential solutions are discussed and open research questions are highlighted. Lastly, prospective applications of voltage‐controlled magnetic tunnel junctions (VC‐MTJs) in security applications, extending beyond their traditional role as memory devices are explored.
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- PAR ID:
- 10439611
- Publisher / Repository:
- Wiley Blackwell (John Wiley & Sons)
- Date Published:
- Journal Name:
- Advanced Materials Technologies
- Volume:
- 8
- Issue:
- 18
- ISSN:
- 2365-709X
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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