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- First Measurement of the Nuclear-Recoil Ionization Yield in Silicon at 100 eV
Title:
First Measurement of the Nuclear-Recoil Ionization Yield in Silicon at 100 eV
- PAR ID:
- 10448347
- Author(s) / Creator(s):
- Albakry, M. F.; Alkhatib, I.; Alonso, D.; Amaral, D. W. P.; Aralis, T.; Aramaki, T.; Arnquist, I. J.; Ataee Langroudy, I.; Azadbakht, E.; Banik, S.; Bathurst, C.; Bhattacharyya, R.; Brink, P. L.; Bunker, R.; Cabrera, B.; Calkins, R.; Cameron, R. A.; Cartaro, C.; Cerdeño, D. G.; Chang, Y. -Y.more » ; Chaudhuri, M.; Chen, R.; Chott, N.; Cooley, J.; Coombes, H.; Corbett, J.; Cushman, P.; Das, S.; De Brienne, F.; Rios, M.; Dharani, S.; di Vacri, M. L.; Diamond, M. D.; Elwan, M.; Fascione, E.; Figueroa-Feliciano, E.; Fink, C. W.; Fouts, K.; Fritts, M.; Gerbier, G.; Germond, R.; Ghaith, M.; Golwala, S. R.; Hall, J.; Harms, S. A. S.; Hassan, N.; Hines, B. A.; Hong, Z.; Hoppe, E. W.; Hsu, L.; Huber, M. E.; Iyer, V.; Kashyap, V. K. S.; Kelsey, M. H.; Kubik, A.; Kurinsky, N. A.; Lee, M.; Litke, M.; Liu, J.; Liu, Y.; Loer, B.; Lopez Asamar, E.; Lukens, P.; MacFarlane, D. B.; Mahapatra, R.; Mast, N.; Mayer, A. J.; Meyer zu Theenhausen, H.; Michaud, É.; Michielin, E.; Mirabolfathi, N.; Mohanty, B.; Nebolsky, B.; Nelson, J.; Neog, H.; Novati, V.; Orrell, J. L.; Osborne, M. D.; Oser, S. M.; Page, W. A.; Pandey, L.; Pandey, S.; Partridge, R.; Pedreros, D. S.; Perna, L.; Podviianiuk, R.; Ponce, F.; Poudel, S.; Pradeep, A.; Pyle, M.; Rau, W.; Reid, E.; Ren, R.; Reynolds, T.; Tanner, E.; Roberts, A.; Robinson, A. E.; Saab, T.; Sadek, D.; Sadoulet, B.; Sahoo, S. P.; Saikia, I.; Sander, J.; Sattari, A.; Schmidt, B.; Schnee, R. W.; Scorza, S.; Serfass, B.; Poudel, S. S.; Sincavage, D. J.; Sinervo, P.; Speaks, Z.; Street, J.; Sun, H.; Terry, G. D.; Thasrawala, F. K.; Toback, D.; Underwood, R.; Verma, S.; Villano, A. N.; von Krosigk, B.; Watkins, S. L.; Wen, O.; Williams, Z.; Wilson, M. J.; Winchell, J.; Wykoff, K.; Yellin, S.; Young, B. A.; Yu, T. C.; Zatschler, B.; Zatschler, S.; Zaytsev, A.; Zeolla, A.; Zhang, E.; Zheng, L.; Zheng, Y.; Zuniga, A.; An, P.; Barbeau, P. S.; Hedges, S. C.; Li, L.; Runge, J.; SuperCDMS Collaboration « less
- Publisher / Repository:
- American Physical Society
- Date Published:
- Journal Name:
- Physical Review Letters
- Volume:
- 131
- Issue:
- 9
- ISSN:
- 0031-9007; PRLTAO
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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- Journal Article:
- https://doi.org/10.1103/PhysRevLett.131.091801
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!- Citation Formats
- MLA
Cite: MLA FormatAlbakry, M. F., Alkhatib, I., Alonso, D., Amaral, D. W. P., Aralis, T., Aramaki, T., Arnquist, I. J., Ataee Langroudy, I., Azadbakht, E., Banik, S., Bathurst, C., Bhattacharyya, R., Brink, P. L., Bunker, R., Cabrera, B., Calkins, R., Cameron, R. A., Cartaro, C., Cerdeño, D. G., Chang, Y. -Y., Chaudhuri, M., Chen, R., Chott, N., Cooley, J., Coombes, H., Corbett, J., Cushman, P., Das, S., De Brienne, F., Rios, M., Dharani, S., di Vacri, M. L., Diamond, M. D., Elwan, M., Fascione, E., Figueroa-Feliciano, E., Fink, C. W., Fouts, K., Fritts, M., Gerbier, G., Germond, R., Ghaith, M., Golwala, S. R., Hall, J., Harms, S. A. S., Hassan, N., Hines, B. A., Hong, Z., Hoppe, E. W., Hsu, L., Huber, M. E., Iyer, V., Kashyap, V. K. S., Kelsey, M. H., Kubik, A., Kurinsky, N. A., Lee, M., Litke, M., Liu, J., Liu, Y., Loer, B., Lopez Asamar, E., Lukens, P., MacFarlane, D. B., Mahapatra, R., Mast, N., Mayer, A. J., Meyer zu Theenhausen, H., Michaud, É., Michielin, E., Mirabolfathi, N., Mohanty, B., Nebolsky, B., Nelson, J., Neog, H., Novati, V., Orrell, J. L., Osborne, M. D., Oser, S. M., Page, W. A., Pandey, L., Pandey, S., Partridge, R., Pedreros, D. S., Perna, L., Podviianiuk, R., Ponce, F., Poudel, S., Pradeep, A., Pyle, M., Rau, W., Reid, E., Ren, R., Reynolds, T., Tanner, E., Roberts, A., Robinson, A. E., Saab, T., Sadek, D., Sadoulet, B., Sahoo, S. P., Saikia, I., Sander, J., Sattari, A., Schmidt, B., Schnee, R. W., Scorza, S., Serfass, B., Poudel, S. S., Sincavage, D. J., Sinervo, P., Speaks, Z., Street, J., Sun, H., Terry, G. D., Thasrawala, F. K., Toback, D., Underwood, R., Verma, S., Villano, A. N., von Krosigk, B., Watkins, S. L., Wen, O., Williams, Z., Wilson, M. J., Winchell, J., Wykoff, K., Yellin, S., Young, B. A., Yu, T. C., Zatschler, B., Zatschler, S., Zaytsev, A., Zeolla, A., Zhang, E., Zheng, L., Zheng, Y., Zuniga, A., An, P., Barbeau, P. S., Hedges, S. C., Li, L., Runge, J., and SuperCDMS Collaboration. First Measurement of the Nuclear-Recoil Ionization Yield in Silicon at 100 eV. Physical Review Letters 131.9 Web. doi:10.1103/PhysRevLett.131.091801.
- APA
Cite: APA FormatAlbakry, M. F., Alkhatib, I., Alonso, D., Amaral, D. W. P., Aralis, T., Aramaki, T., Arnquist, I. J., Ataee Langroudy, I., Azadbakht, E., Banik, S., Bathurst, C., Bhattacharyya, R., Brink, P. L., Bunker, R., Cabrera, B., Calkins, R., Cameron, R. A., Cartaro, C., Cerdeño, D. G., Chang, Y. -Y., Chaudhuri, M., Chen, R., Chott, N., Cooley, J., Coombes, H., Corbett, J., Cushman, P., Das, S., De Brienne, F., Rios, M., Dharani, S., di Vacri, M. L., Diamond, M. D., Elwan, M., Fascione, E., Figueroa-Feliciano, E., Fink, C. W., Fouts, K., Fritts, M., Gerbier, G., Germond, R., Ghaith, M., Golwala, S. R., Hall, J., Harms, S. A. S., Hassan, N., Hines, B. A., Hong, Z., Hoppe, E. W., Hsu, L., Huber, M. E., Iyer, V., Kashyap, V. K. S., Kelsey, M. H., Kubik, A., Kurinsky, N. A., Lee, M., Litke, M., Liu, J., Liu, Y., Loer, B., Lopez Asamar, E., Lukens, P., MacFarlane, D. B., Mahapatra, R., Mast, N., Mayer, A. J., Meyer zu Theenhausen, H., Michaud, É., Michielin, E., Mirabolfathi, N., Mohanty, B., Nebolsky, B., Nelson, J., Neog, H., Novati, V., Orrell, J. L., Osborne, M. D., Oser, S. M., Page, W. A., Pandey, L., Pandey, S., Partridge, R., Pedreros, D. S., Perna, L., Podviianiuk, R., Ponce, F., Poudel, S., Pradeep, A., Pyle, M., Rau, W., Reid, E., Ren, R., Reynolds, T., Tanner, E., Roberts, A., Robinson, A. E., Saab, T., Sadek, D., Sadoulet, B., Sahoo, S. P., Saikia, I., Sander, J., Sattari, A., Schmidt, B., Schnee, R. W., Scorza, S., Serfass, B., Poudel, S. S., Sincavage, D. J., Sinervo, P., Speaks, Z., Street, J., Sun, H., Terry, G. D., Thasrawala, F. K., Toback, D., Underwood, R., Verma, S., Villano, A. N., von Krosigk, B., Watkins, S. L., Wen, O., Williams, Z., Wilson, M. J., Winchell, J., Wykoff, K., Yellin, S., Young, B. A., Yu, T. C., Zatschler, B., Zatschler, S., Zaytsev, A., Zeolla, A., Zhang, E., Zheng, L., Zheng, Y., Zuniga, A., An, P., Barbeau, P. S., Hedges, S. C., Li, L., Runge, J., & SuperCDMS Collaboration. First Measurement of the Nuclear-Recoil Ionization Yield in Silicon at 100 eV. Physical Review Letters, 131 (9). https://doi.org/10.1103/PhysRevLett.131.091801
- Chicago
Cite: Chicago FormatAlbakry, M. F., Alkhatib, I., Alonso, D., Amaral, D. W. P., Aralis, T., Aramaki, T., Arnquist, I. J., Ataee Langroudy, I., Azadbakht, E., Banik, S., Bathurst, C., Bhattacharyya, R., Brink, P. L., Bunker, R., Cabrera, B., Calkins, R., Cameron, R. A., Cartaro, C., Cerdeño, D. G., Chang, Y. -Y., Chaudhuri, M., Chen, R., Chott, N., Cooley, J., Coombes, H., Corbett, J., Cushman, P., Das, S., De Brienne, F., Rios, M., Dharani, S., di Vacri, M. L., Diamond, M. D., Elwan, M., Fascione, E., Figueroa-Feliciano, E., Fink, C. W., Fouts, K., Fritts, M., Gerbier, G., Germond, R., Ghaith, M., Golwala, S. R., Hall, J., Harms, S. A. S., Hassan, N., Hines, B. A., Hong, Z., Hoppe, E. W., Hsu, L., Huber, M. E., Iyer, V., Kashyap, V. K. S., Kelsey, M. H., Kubik, A., Kurinsky, N. A., Lee, M., Litke, M., Liu, J., Liu, Y., Loer, B., Lopez Asamar, E., Lukens, P., MacFarlane, D. B., Mahapatra, R., Mast, N., Mayer, A. J., Meyer zu Theenhausen, H., Michaud, É., Michielin, E., Mirabolfathi, N., Mohanty, B., Nebolsky, B., Nelson, J., Neog, H., Novati, V., Orrell, J. L., Osborne, M. D., Oser, S. M., Page, W. A., Pandey, L., Pandey, S., Partridge, R., Pedreros, D. S., Perna, L., Podviianiuk, R., Ponce, F., Poudel, S., Pradeep, A., Pyle, M., Rau, W., Reid, E., Ren, R., Reynolds, T., Tanner, E., Roberts, A., Robinson, A. E., Saab, T., Sadek, D., Sadoulet, B., Sahoo, S. P., Saikia, I., Sander, J., Sattari, A., Schmidt, B., Schnee, R. W., Scorza, S., Serfass, B., Poudel, S. S., Sincavage, D. J., Sinervo, P., Speaks, Z., Street, J., Sun, H., Terry, G. D., Thasrawala, F. K., Toback, D., Underwood, R., Verma, S., Villano, A. N., von Krosigk, B., Watkins, S. L., Wen, O., Williams, Z., Wilson, M. J., Winchell, J., Wykoff, K., Yellin, S., Young, B. A., Yu, T. C., Zatschler, B., Zatschler, S., Zaytsev, A., Zeolla, A., Zhang, E., Zheng, L., Zheng, Y., Zuniga, A., An, P., Barbeau, P. S., Hedges, S. C., Li, L., Runge, J., and SuperCDMS Collaboration. "First Measurement of the Nuclear-Recoil Ionization Yield in Silicon at 100 eV". Physical Review Letters 131 (9). Country unknown/Code not available: American Physical Society. https://doi.org/10.1103/PhysRevLett.131.091801. https://par.nsf.gov/biblio/10448347.
- BibTeX
Cite: BibTeX Format@article{osti_10448347,
place = {Country unknown/Code not available}, title = {First Measurement of the Nuclear-Recoil Ionization Yield in Silicon at 100 eV}, url = {https://par.nsf.gov/biblio/10448347}, DOI = {10.1103/PhysRevLett.131.091801}, abstractNote = {Not Available}, journal = {Physical Review Letters}, volume = {131}, number = {9}, publisher = {American Physical Society}, author = {Albakry, M. F. and Alkhatib, I. and Alonso, D. and Amaral, D. W. P. and Aralis, T. and Aramaki, T. and Arnquist, I. J. and Ataee Langroudy, I. and Azadbakht, E. and Banik, S. and Bathurst, C. and Bhattacharyya, R. and Brink, P. L. and Bunker, R. and Cabrera, B. and Calkins, R. and Cameron, R. A. and Cartaro, C. and Cerdeño, D. G. and Chang, Y. -Y. and Chaudhuri, M. and Chen, R. and Chott, N. and Cooley, J. and Coombes, H. and Corbett, J. and Cushman, P. and Das, S. and De Brienne, F. and Rios, M. and Dharani, S. and di Vacri, M. L. and Diamond, M. D. and Elwan, M. and Fascione, E. and Figueroa-Feliciano, E. and Fink, C. W. and Fouts, K. and Fritts, M. and Gerbier, G. and Germond, R. and Ghaith, M. and Golwala, S. R. and Hall, J. and Harms, S. A. S. and Hassan, N. and Hines, B. A. and Hong, Z. and Hoppe, E. W. and Hsu, L. and Huber, M. E. and Iyer, V. and Kashyap, V. K. S. and Kelsey, M. H. and Kubik, A. and Kurinsky, N. A. and Lee, M. and Litke, M. and Liu, J. and Liu, Y. and Loer, B. and Lopez Asamar, E. and Lukens, P. and MacFarlane, D. B. and Mahapatra, R. and Mast, N. and Mayer, A. J. and Meyer zu Theenhausen, H. and Michaud, É. and Michielin, E. and Mirabolfathi, N. and Mohanty, B. and Nebolsky, B. and Nelson, J. and Neog, H. and Novati, V. and Orrell, J. L. and Osborne, M. D. and Oser, S. M. and Page, W. A. and Pandey, L. and Pandey, S. and Partridge, R. and Pedreros, D. S. and Perna, L. and Podviianiuk, R. and Ponce, F. and Poudel, S. and Pradeep, A. and Pyle, M. and Rau, W. and Reid, E. and Ren, R. and Reynolds, T. and Tanner, E. and Roberts, A. and Robinson, A. E. and Saab, T. and Sadek, D. and Sadoulet, B. and Sahoo, S. P. and Saikia, I. and Sander, J. and Sattari, A. and Schmidt, B. and Schnee, R. W. and Scorza, S. and Serfass, B. and Poudel, S. S. and Sincavage, D. J. and Sinervo, P. and Speaks, Z. and Street, J. and Sun, H. and Terry, G. D. and Thasrawala, F. K. and Toback, D. and Underwood, R. and Verma, S. and Villano, A. N. and von Krosigk, B. and Watkins, S. L. and Wen, O. and Williams, Z. and Wilson, M. J. and Winchell, J. and Wykoff, K. and Yellin, S. and Young, B. A. and Yu, T. C. and Zatschler, B. and Zatschler, S. and Zaytsev, A. and Zeolla, A. and Zhang, E. and Zheng, L. and Zheng, Y. and Zuniga, A. and An, P. and Barbeau, P. S. and Hedges, S. C. and Li, L. and Runge, J. and SuperCDMS Collaboration}, }
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